Automatic acquisition and testing method for high-amplitude differential signal
A differential signal and test method technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of labor-intensive, time-consuming, difficult to ensure circuit consistency, etc., to achieve mass production, save labor costs, and shorten the circuit The effect of test time
Active Publication Date: 2016-04-20
58TH RES INST OF CETC
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Problems solved by technology
[0003] However, the test of high-amplitude differential signals has become a difficult problem at present. The actual test system can only meet the test of ordinary digital signals and low-amplitude differential signals, and it is difficult to meet the test of high-amplitude differential signals.
The current test method for high-amplitude differential signals is to use an oscilloscope to test manually. Manual testing is time-consuming and labor-intensive, and it is difficult to ensure circuit consistency by manual measurement and judgment, and manual testing cannot meet the needs of mass production of chips.
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[0023] The examples enumerated in the present invention are only used to help the understanding of the present invention, and should not be construed as a limitation on the protection scope of the present invention. Improvements and modifications can be made to the present invention, and these improvements and modifications also fall within the scope of the claims of the present invention.
[0024] like figure 1 As shown, an automatic acquisition and testing method applied to a high-amplitude differential signal of the present invention includes the following steps:
[0025] (1) Start the test and input the test vector
[0026] NI system 1 starts the test command, namely the SOT signal, through the PCI6259 control board through the dedicated Pin68 connection cable for testing, and the tester system 2 inputs the test vector to the DUT test board 21 through the interface board. The test vector is simulated by the device logic. Generated, the tester system 2 channels form an in...
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The invention relates to an automatic acquisition and testing method for a high-amplitude differential signal. An NI system controls an oscilloscope to carry out automatic data collection and testing; and inputting of a test vector and determination and displaying of a testing result are completed by cooperating with a testing machine system. According to the method, automatic collection, testing and returning is carried out on a high-amplitude differential signal and a testing result is stored as a text file, so that problems that the traditional testing machine can not complete collection and measurement of the high-amplitude differential signal and changing from hand-operated testing to automatic testing by using an oscilloscope can not be realized easily can be solved. Therefore, the high-amplitude differential signal circuit testing efficiency can be improved substantially; and the testing cost is saved.
Description
technical field [0001] The invention relates to the field of automatic testing of high-amplitude differential analog signals, in particular to an automatic acquisition and testing method applied to high-amplitude differential signals. Background technique [0002] With the continuous development of microelectronics technology, and in order to meet the requirements of high reliability of military components, traditional bus protocols have been unable to meet the requirements. Due to its better anti-interference, the high-amplitude differential serial bus has less The signal line and longer transmission distance have won the favor of many designers. [0003] However, the test of high-amplitude differential signals has become a difficult problem at present. In reality, the test system can only meet the test of ordinary digital signals and low-amplitude differential signals, and it is difficult to meet the test of high-amplitude differential signals. The current test method for...
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IPC IPC(8): G01R13/00
CPCG01R13/00
Inventor 刘士全秦晨飞严华鑫徐睿汤赛楠
Owner 58TH RES INST OF CETC