An automatic acquisition and test method applied to high-amplitude differential signals

Abstract

The invention relates to an automatic acquisition and testing method for a high-amplitude differential signal. An NI system controls an oscilloscope to carry out automatic data collection and testing; and inputting of a test vector and determination and displaying of a testing result are completed by cooperating with a testing machine system. According to the method, automatic collection, testing and returning is carried out on a high-amplitude differential signal and a testing result is stored as a text file, so that problems that the traditional testing machine can not complete collection and measurement of the high-amplitude differential signal and changing from hand-operated testing to automatic testing by using an oscilloscope can not be realized easily can be solved. Therefore, the high-amplitude differential signal circuit testing efficiency can be improved substantially; and the testing cost is saved.

Description

technical field [0001] The invention relates to the field of automatic testing of high-amplitude differential analog signals, in particular to an automatic collection and testing method applied to high-amplitude differential signals. Background technique [0002] With the continuous development of microelectronics technology, and in order to meet the high reliability requirements of military components, the traditional bus protocol can no longer meet the requirements, and the high-amplitude differential serial bus is less The signal line and longer transmission distance have won the favor of many designers. [0003] However, the test of high-amplitude differential signals has become a difficult problem at present. The actual test system can only meet the test of ordinary digital signals and low-amplitude differential signals, and it is difficult to meet the test of high-amplitude differential signals. The current test method for high-amplitude differential signals is to use...

AI Technical Summary

Problems solved by technology

[0003] However, the test of high-amplitude differential signals has become a difficult problem at present. The actual test system can only meet the test of ordinary digital signals and low-amplitude differential signals, and it is difficult to meet the test of high-amplitude differential signals.

The current test method for high-amplitude differential signals is to use an oscilloscope to test manually. Manual testing is time-consuming and labor-intensive, and it is difficult to ensure circuit consistency by manual measurement and judgment, and manual testing cannot meet the needs of mass production of chips.

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