Method for reducing data read-write errors of EEPROM (electrically erasable programmable read-only memory)

A technology of data reading and writing and data writing, which is applied in the direction of response error generation, redundant code error detection, input/output to record carrier, etc., and can solve problems such as loss of storage unit, unstable program, and shortened storage time , to achieve the effect of low error rate of writing and reading data, reducing the probability of data reading and writing errors, and good program robustness

Active Publication Date: 2013-01-23
SHENZHEN HANGSHENG ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology describes an improved method for storing data in memory devices called RAM (Random Access Memory). By combining two different types of storage areas: one uses CRC checking data from both the data region array and spare area array, another includes CRC checks against these stored values during programming or testing operations. These techniques help prevent erroneously accessing certain parts of this memory device when performing various functions like transferring data between them. Overall, this new design improves efficiency and reliability by reducing potential issues related to incorrect accesses caused by unexpected voltage fluctuations or other factors affecting the circuitry within the chip itself.

Problems solved by technology

This patented describes various technical features related with improving non volatile memories like flash cards. These include improvements made over previous designs where programming was done once per second, including improved reliability and longer lifetimes compared to older ones. Additionally, certain techniques have shown promise through preventing incorrect data writes caused by environmental conditions or operating systems issues. Overall, this technology helps improve performance and efficiency while reducing costs associated with storing and managing data stored within them.

Method used

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  • Method for reducing data read-write errors of EEPROM (electrically erasable programmable read-only memory)
  • Method for reducing data read-write errors of EEPROM (electrically erasable programmable read-only memory)
  • Method for reducing data read-write errors of EEPROM (electrically erasable programmable read-only memory)

Examples

Experimental program
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Effect test

Embodiment 1

[0036] This example provides a method to reduce EEPROM data read and write errors, including the following steps:

[0037] The array definition step is to define a buffer array in SRAM and define two arrays in EEPROM, the two arrays defined in the EEPROM are respectively a data area array and a backup area array, and both the data area array and the backup area array include CRC check data;

[0038] Data writing step, when writing data in EEPROM, first put data into the buffer array, and call the write function to write the data of the buffer array into the data area array and the backup area array in order;

[0039] The verification data calculation step is to call the verification function to calculate the CRC verification data of the current backup, and write the CRC verification data to the verification data area of ​​the data area array and the backup area array;

[0040] Data verification step, after the system is powered on and reset, the validity of the data area arra...

Embodiment 2

[0052] On the basis of Example 1, this example defines an array in SRAM: EEPROMBufferData[EepromPageSize-2], defines two arrays in EEPROM, these two arrays correspond to the data area array EEPROMPagerAddr0[EepromPageSize] and the backup array EEPROMPagerAddr1[EepromPageSize] ], the last two bytes in the data area array and backup array are the data for CRC check.

[0053] When writing data to EEPROM, first put the data into the EEPROMBufferData[EepromPageSize-2] array, call the EepromWriteBlockData() function, and write the n data of this array into the specified area of ​​the EEPROM in order, that is, the data area array EEPROMPagerAddr0[EepromPageSize ] and / or Backup EEPROMPagerAddr1[EepromPageSize]).

[0054] After writing the data, call the CheckWriteDataCRC () function, which will calculate the CRC check data of the current backup and write to the tail two bytes of the corresponding data area array and the backup area array of the EEPROM. The CRC check data is preferably...

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Abstract

The invention provides a method for reducing data read-write errors of an EEPROM. The method comprises the following steps: an array defining step for defining a buffer array in an SRAM (static random access memory) and defining a data area array and a backup area array in the EEPROM, wherein both the data area array and the backup area array include CRC (cyclic redundancy check) data; a data writing step for writing data in the EEPROM; a check data computation step for writing the computed CRC data in check data areas of the data area array and the backup area array; a data checking step for checking validity of the data area array and the backup area array by the CRC data; a data restoring step; and a default overriding step. The method for reducing data read-write errors of the EEPROM can effectively reduce the data read-write error probability of the EEPROM under abnormal conditions including read-write power-down, strong interference, strong electrostatic and the like, can not occupy more space of the EEPROM, is less in software overhead, and is stable and reliable in program.

Description

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Claims

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Application Information

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Owner SHENZHEN HANGSHENG ELECTRONICS
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