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Transistor screening instrument calibration device

A technology for calibrating devices and transistors, applied to measuring devices, instruments, and measuring electrical variables, etc., can solve problems such as low efficiency and large individual differences

Active Publication Date: 2015-07-08
深圳深爱半导体股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Based on this, it is necessary to provide a high-efficiency, fast and high-precision calibration device for transistor screening instruments to solve the problems of manual calibration, low efficiency, and large individual differences.

Method used

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  • Transistor screening instrument calibration device
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Embodiment Construction

[0024] A transistor screening instrument calibration device, used to calibrate the transistor screening instrument, by classifying and packaging several different types of standard transistors to be calibrated, and using the second selection switch to select different models, and then through the first selection The switch selects a standard transistor among a certain number of standard transistors of the same model for calibration. The transistor screening instrument is calibrated by selecting different standard transistors by model and individual selection switches, avoiding the problem of measurement errors caused by manual measurement, and making the calibration high in efficiency, high in precision and good in repeatability.

[0025] The present invention will be described in further detail below by means of the accompanying drawings and examples.

[0026] figure 1 It is a schematic diagram of a calibration device for a transistor screening instrument according to an emb...

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Abstract

The invention discloses a transistor screening instrument calibration device. A standard transistor which is subjected to transistor screening instrument calibration is packaged by a standard transistor carrier; and during testing, different standard transistors are selected for calibrating through a first selective switch. The calibration is performed by using the transistor screening instrument calibration device so that the problems that the test speed is low, the efficiency is low and the measurement data errors are caused by individual difference in manual measurement when the calibration is performed manually are avoided; the measurement speed is accelerated; the measurement efficiency is improved; the measurement precision is high; and the repeatability is good.

Description

technical field [0001] The invention relates to the field of instrument calibration, in particular to a transistor screening instrument calibration device. Background technique [0002] With the development of electronic technology, transistors are widely used in circuits. When using a transistor, it is usually necessary to know whether the transistor is available and various characteristic parameters of the transistor, so the transistor is generally screened with a transistor screening instrument before use. [0003] When the transistor screening instrument is used, it is necessary to ensure the accuracy of its own test accuracy, so it is generally necessary to calibrate the transistor screening instrument after it has been used for a period of time. Because the transistor screening instrument is a non-standard instrument, the statutory metrology institution cannot verify or calibrate it at present. Generally, a certain number of several different types of standard transis...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
Inventor 王荣
Owner 深圳深爱半导体股份有限公司