Current-voltage mapping construction method based on adjacent stimulus measurement model

A technology for stimulating measurement and construction methods, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve the problems that the direct physical meaning of the current-voltage mapping cannot be given, and the calculation is complicated

Active Publication Date: 2013-06-19
BEIHANG UNIV
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, neither of these two methods can give the direct physical mea

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Current-voltage mapping construction method based on adjacent stimulus measurement model
  • Current-voltage mapping construction method based on adjacent stimulus measurement model
  • Current-voltage mapping construction method based on adjacent stimulus measurement model

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0052] see figure 1 , Algorithmic block diagram of a current-voltage mapping construction method based on adjacent excitation measurement patterns. by figure 2 The 16 ring-shaped resistor networks connected end to end are taken as an example to illustrate the specific implementation of the method.

[0053] The method comprises the steps of:

[0054] Step 1, for figure 2 For the 16 ring resistance networks shown, if the adjacent excitation measurement mode is used, that is, the unit current flows from the ith node (1≤i≤16) into the field under test, and the i+1th node flows out, then the kth node (1≤k≤16) potential and the potential of the k+1th node The difference between satisfies:

[0055] U i , i + 1 k + 1 - U i , i ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a current-voltage mapping construction method based on an adjacent stimulus measurement model. The current-voltage mapping construction method based on the adjacent stimulus measurement model aims at the adjacent stimulus measurement model of a sensor which is provided with N electrodes in electrical tomography, utilizes a formula which is reduced by calculating parameters such as an impedance matrix and an electric current density matrix to uniquely calculate a current-voltage matrix and to construct current-voltage mapping based on the adjacent stimulus measurement model. The invention provides the current-voltage mapping construction method based on the adjacent stimulus measurement model. The current-voltage mapping construction method based on the adjacent stimulus measurement model can be applied to a direct reconstruction algorithm in an electrical tomography field, provides direct physical significance of the current-voltage mapping, does not relate to matrix inversion and is easy to operate.

Description

technical field [0001] The invention relates to the field of electrical tomography, in particular to a new current-voltage mapping construction method based on adjacent excitation measurement modes. Background technique [0002] Electrical tomography (ET for short) technology is a kind of tomography technology. It applies excitation to the measured object, detects the change of its boundary value, and uses a specific reconstruction algorithm to reconstruct the distribution of the internal electrical characteristic parameters of the measured object, so as to obtain the internal distribution of the object. Compared with other tomography techniques, electrical tomography has the advantages of no radiation, fast response, and low cost. [0003] The reconstruction algorithms in electrical tomography can be generally divided into two categories: reconstruction algorithms based on sensitivity matrix and direct reconstruction algorithms. Using the former usually requires solving i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/00G06F19/00
Inventor 徐立军孙世杰曹章
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap