Circuit used for testing service life of temperature controlled switch of ballast
A temperature-controlled switch and ballast technology, which is used in circuit breaker testing and other directions to achieve the effect of improving work efficiency
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[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0020] Embodiments of the present invention will be described below with reference to the accompanying drawings. see figure 1 , which is a schematic diagram of a circuit structure for testing the life of a temperature-controlled switch in a ballast in an embodiment of the present invention. In this embodiment, the circuit includes a DC power supply module 10 , a counter 11 , a first relay K1 , a second relay K2 , an optical coupling tube 12 , a MOS tube Q1 , and a...
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