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Oscilloscope capable of improving measurement accuracy and measurement method

An oscilloscope and accuracy technology, applied in the direction of digital variable display, etc., can solve the problems of reducing the accuracy of measurement values, difficult to balance accuracy and response speed, and reducing the response speed of oscilloscopes, so as to achieve a balance between measurement accuracy and response speed, and improve The effect of execution efficiency

Active Publication Date: 2013-06-26
RIGOL
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AI Technical Summary

Problems solved by technology

[0006] Using the method of the prior art, the increase of the sampling multiple reduces the amount of waveform point data for measurement and analysis, and at the same time reduces the accuracy of the measured value; while the reduction of the sampling multiple leads to an increase in the number of sampled waveform points, and the data that the oscilloscope needs to process The greater the amount, the oscilloscope’s response speed will inevitably be reduced; therefore, the software processing method in the prior art is difficult to achieve a balance between measurement accuracy and response speed

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  • Oscilloscope capable of improving measurement accuracy and measurement method
  • Oscilloscope capable of improving measurement accuracy and measurement method
  • Oscilloscope capable of improving measurement accuracy and measurement method

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Embodiment Construction

[0028] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts fall within the protection scope of the claims of the present invention.

[0029] The embodiment of the present invention proposes an oscilloscope and a measurement method that can improve measurement accuracy. When the sampling multiple is sufficiently large, the integrity of the information amount of the waveform, especially the integrity of the amplitude information, is ensured as much as possible....

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Abstract

Provided are an oscilloscope capable of improving measurement accuracy and a measurement method. The oscilloscope comprises a storage unit used for storing collected waveform points, a peak sampling unit used for grouping the waveform points in the storage unit, sampling each group of waveform points to obtain maximum value and minimum value of each group of waveform points, a measurement data caching unit used for storing the maximum value and the minimum value of each group of waveform points and a measurement unit used for adopting the waveform points in the measurement data caching unit to conduct waveform measurement. By means of the technical scheme, the waveform points in the storage unit of the oscilloscope are sampled and grouped, and the maximum value and the minimum value of each group serve as the sampling value to be stored in the measurement data caching unit. Waveform outline information completion is maintained to the greatest extent under the condition that the sampling rate is large enough. Source data of measurement analysis are subjected to measurement preprocessing, measurement analysis execution efficiency is improved, and balance between measurement accuracy and response speed can be achieved accordingly.

Description

technical field [0001] The invention relates to the technical field of oscilloscopes, in particular to an oscilloscope and a measurement method capable of improving measurement accuracy. Background technique [0002] The measured signal can be measured and analyzed with a digital oscilloscope, and the measurement result can be obtained. Specifically: after the measured signal is collected, the obtained collected waveform points are stored in the oscilloscope storage unit (which can be a memory or an external memory), and then the collected waveform points in the storage unit are measured and analyzed to obtain the measurement results. Under the same conditions, the more waveform points are collected, the more accurate the measurement results will be. However, the more waveform points are collected, the greater the amount of data the oscilloscope needs to process, which will inevitably reduce the response speed of the oscilloscope. Therefore, there needs to be a balance bet...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/02
Inventor 王志彦王悦王铁军李维森
Owner RIGOL
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