Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Failure criterion determination method based on function analysis and mechanism analysis

A technology of failure criterion and determination method, which is applied in the direction of function inspection and detection of faulty computer hardware, etc., can solve the problem of lack of scientific system and method for failure criterion, and achieve good application value and wide applicability

Inactive Publication Date: 2013-08-28
BEIHANG UNIV
View PDF4 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] (1) Purpose of the present invention: Aiming at the problem that the determination of fault criteria in the fault data collection process lacks a scientific system method, a method for determining fault criteria is proposed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Failure criterion determination method based on function analysis and mechanism analysis
  • Failure criterion determination method based on function analysis and mechanism analysis
  • Failure criterion determination method based on function analysis and mechanism analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] A method for determining failure criteria for function analysis and mechanism analysis of the present invention, the flow chart of which is as follows figure 1 As shown, the idea description is as follows figure 2 shown.

[0039] Taking computer products as an example, combined with the attached image 3 , the present invention will be described in further detail.

[0040] Step 1: Divide the computer into two major parts, software and hardware, consider the respective components, divide the system according to this, determine the fault subject at the lowest level and clarify its function, the result of the division is as follows: image 3 shown;

[0041] Step 2: Considering the normal working environment and conditions, find the possible failure modes and corresponding failure mechanisms of the lowest-level failure subject of the computer, listed as follows:

[0042] Table 1 The failure mode and failure mechanism of the mouse

[0043]

[0044]

[0045] Accordi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A failure criterion determination method based on function analysis and mechanism analysis includes a first step of carrying out system level division on products and determining fault bodies of the products at the lowest level and functions of the fault bodies, wherein the 'system level division' refers to the fact that a system is divided into subsystems and components in sequence until smallest analysis units, and the 'lowest level' refers to the fact that the lowest level which can meet technical requirements, a second step of searching possible failure modes and failure mechanisms according to failure mode impact analysis and consultation of expert opinions, analyzing related relations between the failure modes and the failure mechanisms, and building correlation matrixes of the failure modes and the failure mechanisms, and a third step of carrying out classification specific to different function decay modes, combining the established correlation matrixes of the failure modes and the failure mechanisms in the second step, inspecting whether the failure modes are measurable, and determining the failure criterion after classification and corresponding measurability analysis are finished. The failure criterion determination method is wide in applicability, capable of obtaining the appropriate failure criterion, and good in application value.

Description

technical field [0001] The present invention provides a method for determining fault criteria for functional analysis and mechanism analysis, which is based on the functional analysis and mechanism analysis of products respectively, and proposes a systematic method to determine fault criteria, which belongs to fault study and reliability analysis , comprehensive safeguard analysis and other related technical fields. Background technique [0002] Before predicting, formulating, and evaluating indicators such as a product's quality or reliability, it is usually necessary to collect, accumulate, analyze, and process relevant fault data information. Fault data exists in the work and activities of each stage of the product life cycle. It describes the state of the product that cannot complete the specified function under the specified conditions at the specified time, and has time complexity and space complexity. [0003] However, in the current model development process, the pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/26
Inventor 杨军湾梦雅费思邈赵宇
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com