Mass production test device and short-circuit current foldback circuit thereof

Abstract

The invention belongs to the technical field of short-circuit over-current protection, and provides a mass production test device and a short-circuit current foldback circuit of the mass production test device. According to the mass production test device and the short-circuit current foldback circuit of the mass production test device, due to the fact that the short-circuit current foldback circuit which comprises a switch module, a microprocessor, a short-circuit protection module and a current detection module is adopted, when a tested unit is short-circuited, the short-circuit protection module correspondingly leads output current of the switch module to a ground terminal of a direct-current power source according to voltage of the loop output end of the current detection module; when over-current exists in a test loop of the tested unit, the current detection module correspondingly outputs an input end abnormity signal and/or a loop end abnormity signal to drive the microprocessor to give out a disconnection signal so as to control the switch module to rapidly disconnect a current path according to current of the input end and/or the loop end of the tested unit, rapid short-circuit over-current protection for the tested unit and a test circuit is achieved in the test process, the situation that the tested unit and the test circuit are not damaged is ensured, and production efficiency is further improved.

Description

technical field [0001] The invention belongs to the technical field of short-circuit and over-current protection, and in particular relates to a mass production testing device and a short-circuit and over-current protection circuit thereof. Background technique [0002] In the process of mass production of IC chips or power systems, it is necessary to use test equipment to test the units under test such as IC chips or power systems to determine whether various indicators are met. Existing test equipment often lacks short-circuit overcurrent protection functions or It only has a single hardware protection function or software protection function. When the unit under test is short-circuited or over-current, it will fail to quickly implement short-circuit and over-current protection for the test circuit and the unit under test due to the slow response speed, so that the test circuit and the unit under test is damaged and reduces productivity. Contents of the invention [000...

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Problems solved by technology

[0003] The purpose of the present invention is to provide a short-circuit overcurrent protection circuit, which aims to solve the problem that the existing technology cannot implement fast short-circuit overcurrent protection on the test circuit and the unit under test due to the slow response speed when the unit under test occurs short circuit or overcurrent, Thus, the test circuit and the unit under test are damaged and the production efficiency is reduced

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