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A method for constructing instrument self-test display components based on three-state selection tree

A self-test and selection tree technology, applied in the direction of program control devices, etc., can solve the problems of single display style of self-test results, inability to display test results in real time, troublesome selection of self-test items, etc., to achieve clear logic levels and shorten fault detection. and isolation time, the effect of improving reliability and safety

Active Publication Date: 2017-01-04
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main disadvantages of using the method of combining automatic testing and selecting test unit items are: 1. For instruments with a small number of self-test items, it can meet the requirements. With the increase of the complexity of the instrument, the number of self-test items increases. more cumbersome
2. The self-test items are not classified by unit, and the hierarchy is not clear enough
3. Functional self-tests related to whole parts and components cannot be carried out
[0005] The main disadvantages of using the list display method are: 1. The selection of self-test items is cumbersome, and the entire list needs to be browsed
3. For complex instruments, when the number of self-test items is large, the list is too long and the levels are not clear enough
4. The display style of self-test results is single, and it cannot display a certain test result in real time

Method used

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  • A method for constructing instrument self-test display components based on three-state selection tree
  • A method for constructing instrument self-test display components based on three-state selection tree
  • A method for constructing instrument self-test display components based on three-state selection tree

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Embodiment 1

[0032] like figure 1 As shown, the tree in this application is a classic method for solving the problem of selecting and displaying item content in data structures, and the three-state selection tree is an improved data structure for solving polymorphic selection problems such as self-testing. figure 1 An example of a tree. A tree has only one root node A, the nodes other than the root node A are called child nodes B, C, D, E, each child node has only one parent node, the parent node of B, C, E The node is A, the parent node of D is C, and the nodes without child nodes are called leaf nodes B, D, and E. The improved three-state selection tree has three states for each node, selected, unselected, and partially selected. The three-state selection tree is stored using the binary linked list method. The two chain domains of the nodes in the linked list point to the first child node and the next sibling node respectively, and reserve space to store the current state of the node. ...

Embodiment 2

[0062] On the basis of the above examples, if Figure 3-Figure 5 As shown, an instrument self-test display component construction method based on a three-state selection tree, which includes the following steps:

[0063] Step 1: Summarize the self-test items of the whole instrument, define the name of the whole machine, the name of the whole part, the name of the part, and the name of the self-test item, and clarify the logical relationship between the whole machine, the whole part, the part and the self-test item;

[0064] Step 2: Create an empty three-state selection tree;

[0065] Step 3: According to the self-test item and the logical relationship, insert the name of the whole machine, the name of the whole part, the name of the component, and the name of the self-test item into the three-state selection tree as a node of the tree, wherein the self-test item The test item is inserted as a leaf node; the test function of the self-test item is defined, and the function poin...

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Abstract

The invention provides an instrument self-testing display component construction method based on a three-state selection tree. The method includes the specific steps: firstly, summarizing complete instrument self-testing items and logical relations; secondly, creating an empty three-state selection tree; thirdly, inserting a complete machine name, an assembly name, a part name and a self-testing item name serving as a node of the tree into the three-state selection tree according to the self-testing items and the logical relations summarized in the first step; fourthly, sequentially accessing nodes by an inorder traversal algorithm of the tree and establishing a three-state selection relation among the nodes in the three-state selection tree; fifthly, testing the testing items according to testing nodes selected by a user. By the aid of the scheme, an instrument is clear in self-testing item logical level, reasonable in structure and simple and convenient to operate, the state of the instrument can be checked in real time, failure detection and isolation time is shortened, system availability is improved, and the use and maintenance cost of the instrument is reduced.

Description

technical field [0001] The invention belongs to the field of computer application technology, and in particular relates to a method for constructing an instrument self-test display component based on a three-state selection tree. Background technique [0002] With the continuous development of science and technology, human society has entered the information age, with higher requirements and stronger dependence on instruments. The self-test function is a remarkable feature of modern instruments. Whether it is an intelligent instrument or not and one of the signs to measure the level of an intelligent instrument is its self-test and self-diagnosis function. Therefore, in the design process of the instrument, it must have a good self-test The ability to self-diagnose is very important. The increase in the complexity of the instrument has brought many problems to the design of its self-test display components, such as a large number of self-test items, complex logical relation...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F9/44
Inventor 王鹏樊晓腾左永锋徐明哲周俊杰蒋方文
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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