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Method for producing silicon carbide substrate

A technology of silicon carbide and single crystal silicon carbide, which is applied in chemical instruments and methods, semiconductor/solid-state device manufacturing, crystal growth, etc., can solve the problem that silicon carbide is not easy to cut, and achieve the effect of inhibiting fragmentation

Inactive Publication Date: 2014-02-05
SUMITOMO ELECTRIC IND LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, silicon carbide has extremely high hardness, so it is not easy to cut silicon carbide

Method used

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  • Method for producing silicon carbide substrate
  • Method for producing silicon carbide substrate
  • Method for producing silicon carbide substrate

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Embodiment Construction

[0034] Hereinafter, embodiments of the present invention will be described with reference to the drawings. It should be noted that in the attached drawings, the same or corresponding elements are given the same reference numerals, and descriptions thereof will not be repeated. In addition, herein, individual orientations, common orientations, individual planes, and common planes are represented by [], , (), and {}, respectively. Furthermore, in crystallography, a negative index should be represented by a number with a dash "-" on top, whereas in this specification, a negative sign is placed before the number.

[0035] First, a method of manufacturing a silicon carbide substrate in one embodiment of the present invention will be described. refer to figure 1 , in the method for manufacturing a silicon carbide substrate of this embodiment, the following steps are first performed: preparing a single crystal silicon carbide crystal. Specifically, for example, an ingot of single-...

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Abstract

A method for manufacturing a silicon carbide substrate includes the steps of preparing an ingot of single crystal silicon carbide, obtaining a silicon carbide substrate by cutting the ingot, and forming a chamfer portion in a region including an outer peripheral surface of the silicon carbide substrate. In the step of obtaining the silicon carbide substrate, the ingot is cut such that a main surface of the silicon carbide substrate forms an angle of not less than 10° with respect to a {0001} plane.

Description

technical field [0001] The present invention relates to a method of manufacturing a silicon carbide substrate, and more particularly, to a method of manufacturing a silicon carbide substrate capable of suppressing the occurrence of cracks during formation of chamfered portions. Background technique [0002] In recent years, silicon carbide has been increasingly used as a material for forming semiconductor devices in order to realize higher breakdown voltage, lower loss, and use thereof in high-temperature environments, etc. of semiconductor devices. Silicon carbide is a wide-bandgap semiconductor with a larger bandgap than silicon, which has traditionally been widely used as a material for forming semiconductor devices. Therefore, by adopting silicon carbide as a material for forming a semiconductor device, higher breakdown voltage, lower on-resistance, etc. of the semiconductor device can be realized. In addition, semiconductor devices using silicon carbide as a material a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/304
CPCC30B29/36H01L21/02021C30B33/00H01L29/1608C30B33/06H01L29/045
Inventor 冲田恭子藤原伸介
Owner SUMITOMO ELECTRIC IND LTD