A program-controlled language compatibility system and processing method for measuring instruments

Abstract

The invention discloses a program-controlled language compatibility system and processing method for measuring instruments, including a command parser, a converter, a standard command processor and a specific command processor, wherein the command parser includes a standard command parser and a traditional command parser The converter is used to receive the input command from the test system and analyze the input command. Which parser to choose is determined by the compatible language selected by the user; the converter is used to convert the parsed identification code into the command internal code and process the The conversion of the final response data to the response message that can be recognized by the test system; the standard command processor is used to process the command internal code converted by the converter; the specific command processor is used to process the identification code that cannot be converted by the converter. Through the conversion of the identification code to the command internal code and the customized processing of the commands that cannot be converted, the seamless compatibility with the existing test system is realized, the life cycle of the test system is extended, and the test efficiency is improved.

Description

technical field [0001] The invention relates to a measuring instrument program control language compatibility system and a processing method. Background technique [0002] In the pre-SCPI command era, the programming language of measuring instruments used traditional command languages, and the traditional command languages ​​used by different instrument manufacturers were completely different, which made it impossible for some instruments in the test system to use similar instruments from other manufacturers after the production of devices was discontinued. Replacement, resulting in the forced end of the life cycle of these test systems. For this reason, these instrument manufacturers have jointly formulated a set of standard commands for programming languages ​​- SCPI (Standard Commands for Programmable Instruments: Standard Commands for Programmable Instruments) commands. To meet the compatibility requirements of existing test systems. However, due to commercial interest...

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Problems solved by technology

[0006] However, in the prior art, because the command form input by the test system is more flexible and diverse, it is more complicated to realize the conversion from the command input form of the test system to the command form recognizable inside the instrument, especially when there is a one-to-many relationship between the command to be converted and the internal command of the instrument. , many-to-one relationship, the conversion is more difficult, the conversion efficiency is low, and it is difficult to meet the high-efficiency test requirements of the test system; it is also impossible to realize the conversion between commands that have no corresponding relationship between the command to be converted and the internal command of the instrument, but only Command errors can be reported through the command error log, so it is difficult to meet the seamless compatibility with existing test systems

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