Wire testing system and method

Abstract

The invention discloses a wire testing system and method. The system comprises a micro-control unit, at least one detection storage unit, at least on feedback storage unit and a display unit. The data input port of each detection storage unit is connected to the micro-control unit, the data output port of each detection storage unit and the data input port of the corresponding feedback storage unit are connected to the two ends of a wire to be tested respectively, and the display unit is connected to the micro-control unit. Because the data input ports of the detection storage units are connected in parallel, only one IO port of the micro-control unit is occupied, and the expansion of the number of the detection storage units and the expansion of the number of the feedback storage units will not increase the load of the IO port of the micro-control unit; multiple wires can be tested in a one-off mode through expanding the detection storage units in a large amount, the wire testing system and method are suitable for batch detection, different interfaces can be connected as required conveniently, and thus relevant wires or circuit boards equivalent to direct connected leads can be tested.

Description

technical field [0001] The invention relates to electrical connectors, in particular to a wire testing system and method. Background technique [0002] Wires and direct-connection equipment need to be tested after production in the factory, including electrical performance testing, short circuit and open circuit testing, etc. VGA cable, DVI cable, etc. [0003] The basic principles of the wire short circuit and open circuit test devices that exist on the market are all based on loop detection and display faults with LEDs. Since most of the existing detection devices are pure hardware design, the scalability is poor, and the cost of upgrading the number of interfaces is high. Most of them are only for specific wires, and cannot detect multiple wires at the same time or quickly change according to customer needs. Moreover, the LED displays the results, and the detection efficiency is low, so it cannot be adapted to batch detection on the production line. [0004] Therefore,...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a wire testing system and method for the defects of the prior art that it cannot detect multiple wires at the same time, has poor expandability, and is not suitable for batch testing.

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