Precision calibration method of wide-field infrared photoelectric theodolite

A calibration method and technology of theodolite, applied in theodolite, instrument, measuring device, etc., can solve the problems of low photoelectric measurement accuracy and incomplete optical design value of large-field infrared photoelectric theodolite, so as to improve angle measurement accuracy and improve measurement accuracy. Accuracy, the effect of improving regression accuracy

Inactive Publication Date: 2014-04-16
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In order to solve the problem that the error introduced in the processing and assembly process is not completely consistent with the optical design value, resulting in low photoelectric measurement accuracy of the large-field infrared photoelectric theodolite, the present invention provides a large-field infrared photoelectric Theodolite Accuracy Calibration Method

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  • Precision calibration method of wide-field infrared photoelectric theodolite
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  • Precision calibration method of wide-field infrared photoelectric theodolite

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specific Embodiment approach 1

[0012] Specific implementation mode 1. Combination figure 1 Describe this embodiment, the large field of view infrared photoelectric theodolite precision calibration method, this method is realized by the following steps:

[0013] 1. Calibrate the detection frame; if the calibration of the detection frame is completed in the indoor calibration and calibration workshop, the theodolite needs to be placed on the detection platform to work. The calibration system includes a stable platform, infrared photoelectric theodolite, large-diameter collimator, detection frame, 0.5 "Leica theodolite and other systems. After adjusting the detection platform stably, use the 0.5" Leica theodolite to check the 1# light pipe with azimuth angle of 0° and pitch angle of 0°, the azimuth angle of 90° and pitch angle of 0° with 5# light pipe and the azimuth The 6# light pipe with an angle of 90° and a pitch angle of 65° is calibrated; the calibration value is used as the calculated true value. The c...

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Abstract

The invention discloses a precision calibration method of a wide-field infrared photoelectric theodolite, relates to the field of photoelectric measuring and controlling, and solves the problem in the prior art that an error is led to the processing and debugging processes and is not completely consistent with an optical design value, resulting in low photoelectric measurement precision of the wide-field infrared photoelectric theodolite. The precision calibration method comprises the following steps: calibrating a detection rack; collecting model data; building a calibration model and precision detection; obtaining a root-mean-square value of a measurement angle. A multi-element regression analysis method is applied to correction of a miss distance, so that the residual sum of squares between an observation value and a regression value is the minimal, and the regression precision is improved. The wide-field is subjected to partition processing, multi-element regression analysis calculation is carried out on each subarea, and improvement of the calculation precision is facilitated, so as to indirectly improve the measurement angle precision.

Description

technical field [0001] The invention relates to the field of photoelectric measurement and control, in particular to a method for calibrating the accuracy of a large field of view infrared photoelectric theodolite, which can be used to improve the angle measurement accuracy of the large field of view infrared photoelectric theodolite in the precision detection of the photoelectric theodolite. In the field test experiment, it can be used to improve the target's outer ballistic trajectory coordinates. Background technique [0002] During the launch test of missiles and spacecraft, most of the data reflecting the test situation, such as the flight trajectory of the rocket and the orbit of the satellite, are obtained through measurement by radio and optical external measurement equipment. The measurement accuracy of these external measurement equipment marks the The measurement and control level of spacecraft tests such as missiles and satellites. Since measurement data and pre...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
CPCG01C1/02G01C25/00
Inventor 刘岩俊闫海霞
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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