Memory card automatic insertion and removal test structure

Abstract

The invention discloses a memory card automatic plugging test structure. The memory card automatic plugging test structure comprises a memory fixation rod, a push rod and a plurality of elastomers. The memory fixation rod and the push rod can perform back-and-forth linear motion towards a test slot; one end of the push rod is connected with an external driving device and the other end can abut against the memory fixation rod; and one end of each elastomer is fixed and stopped to move and the other end is connected with the memory fixation rod. Firstly, a memory card is fixed on the memory fixation rod, the external driving device drives the push rod to perform push movement, the push rod abuts against the memory fixation rod to perform movement together so that the memory card can be inserted into a corresponding test slot by the memory fixation rod, after testing is finished, the external driving device drives the push rod to perform pulling movement, the push rod and the memory fixation rod are separated from each other, the memory fixation rod rebounds back to an initial position under the effects of the elastomers such that automatic plugging of the memory card can be realized; in addition, the structure design of a dialing piece enables the test structure to be provided with a function of automatically opening the ear clips at the two sides of the test slot, and the automatic plugging of the memory card is further facilitated.

Description

technical field [0001] The invention belongs to the field of memory card detection devices, and in particular relates to a structure capable of automatically inserting and removing the memory card during memory card testing. Background technique [0002] In the prior art, the memory card test generally adopts manual insertion and removal of the memory card, which is not only inconvenient to operate, low in efficiency, and consumes manpower, but also prone to some adverse consequences due to human factors, such as the operator failing to insert the memory card in place and causing the test to fail. The result is bad, or the operator uses too much force when inserting or removing the memory card, causing damage to the memory card or the slot. Contents of the invention [0003] In order to overcome the above-mentioned defects, the present invention provides a memory card automatic plug-in test structure. The memory card automatic plug-in test structure of the present inventio...

AI Technical Summary

Problems solved by technology

[0002] In the prior art, the memory card test generally adopts manual insertion and removal of the memory card, which is not only inconvenient to operate, low in efficiency, and consumes manpower, but also prone to some adverse consequences due to human factors, such as the operator failing to insert the memory card in place and causing the test to fail. The result is bad, or the operator uses too much force when inserting or removing the memory card, causing damage to the memory card or the slot, etc.

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