Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fail safe code functionality

A security code and code technology, applied in the field of fail-safe code functions, can solve problems such as the inability to execute application code safely

Active Publication Date: 2014-05-21
INFINEON TECH AG
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In case an uncorrectable bit error within the application code stored within the NVM has been detected by the ECC mechanism, the application code cannot be safely executed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fail safe code functionality
  • Fail safe code functionality
  • Fail safe code functionality

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] The description herein proceeds with reference to the drawings, wherein like reference numerals are generally utilized to refer to like elements throughout, and wherein various structures are not necessarily drawn to scale. In the following description, for purposes of explanation, numerous specific details are set forth in order to facilitate understanding. It will be apparent, however, to one of ordinary skill in the art that one or more aspects described herein may be practiced with a lesser degree of these specific details. In other instances, well-known structures and devices are shown in block diagram form to facilitate understanding.

[0015] figure 1 A system 100 is illustrated that includes an integrated chip (IC) 102, a microcontroller (μC) 104, and a first storage device 106 that further includes non-volatile memory (NVM), such as flash fast memory, electrically erasable programmable read-only memory (EEPROM), or magnetic memory. The first storage device 1...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Some aspects of the present disclosure provide for a system and method for fault mitigation of a non-volatile memory (NVM) store subject to error correction code (ECC) checking. A simple and robust means to test the integrity of failsafe code stored within the non-volatile memory prior to execution are disclosed. In some embodiments, the failsafe code comprises program elements to communicate the memory failure to other parts of the system, or to execute an orderly shutdown. In the event that an ECC error occurs, the failsafe code can be verified, and upon successful verification, executed.

Description

technical field [0001] The present invention relates to fail-safe code functions. Background technique [0002] In the prior art regarding non-volatile memory (NVM), data bit corruption is common. An error correction code (ECC) mechanism is incorporated in order to detect and correct data bit errors within application code accessed via NVM. The ECC mechanism can detect and correct all single-bit errors and detect some multiple-bit errors. In case an uncorrectable bit error within the application code stored within the NVM has been detected by the ECC mechanism, the application code cannot be safely executed. Contents of the invention [0003] According to an aspect of the present invention, there is provided a method for fail-safe protection in a system, comprising: when retrieving application code from a first storage device, utilizing a first corruption detection and correction mechanism for corruption verification of application code stored in said first storage devi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F21/60
CPCG06F11/1076G06F11/1004G06F11/07G06F11/08
Inventor T.朗格T.莱门泽D.I.佩纳鲁
Owner INFINEON TECH AG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com