Test circuit and display panel
A technology for display panels and test circuits, applied in static indicators, instruments, etc., can solve problems such as occupying space, and achieve the effect of reducing impedance, increasing width, and avoiding display quality degradation.
Inactive Publication Date: 2014-06-18
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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Problems solved by technology
[0004] The on and off of the test signal is controlled by the TFT switching transistor. Although the laser cutting process can be omitted to achieve cost savings, and the test line is far away from the cutting line and the edging area, the yield of the process can be improved. However, the test line is often located in the The peripheral area of the display panel, after the test is completed, the test lines left in the peripheral area of the display panel will occupy a part of the space
Therefore, it is very unfavorable to adopt the above design for a display panel with a narrow frame.
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[0040] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0041] Please refer to figure 1 As shown, as mentioned above, the inventor found that in the design of the peripheral area of the display panel in the prior art, the display panel often adopts dummy pixel (Dummy pixel), common electrode (Array COM), electrostatic discharge The protection circuit (ESD circuit) and the test circuit (Test circuit), this wiring method occupies a certain space, which is not conducive to the design of a narrow bezel display panel.
[0042] Therefore, the inventor proposes a new design for the peripheral area of the display panel, which combines the test circuit and th...
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The embodiment of the invention discloses a test circuit and a display panel. The circuit comprises a test circuit first terminal, a test circuit second terminal, a test signal line, a voltage signal line, a switch transistor and a first electrostatic discharge protection circuit. The first terminal and the second terminal output a test signal and a voltage signal respectively. The test signal line transmits the test signal, one end of the test signal line is connected with the first terminal, and the other end of the test signal line is connected with the switch transistor and a common electrode. The voltage signal line transmits the voltage signal, and the two ends of the voltage signal line are connected with the second terminal and the switch transistor respectively. The switch transistor is connected with the signal line, and is turned on or turned off according to the received voltage signal, so that the test signal and the signal line are connected or disconnected. The first electrostatic discharge protection circuit is respectively connected with the test signal line and the signal line. The test circuit and the display panel are small in occupied space, and design of the narrow-frame display panel is facilitated.
Description
technical field [0001] The invention relates to the field of display technology, in particular to a test circuit and a display panel. Background technique [0002] The traditional test circuit of TFT-LCD (Thin Film Transistor-Liquid Crystal Display) panel is directly connected to the signal line (such as scanning line / data line) inside the display panel, and laser cutting is required after the test is completed process, cut off their connection, the display panel can be normally lit, and the traditional test method makes the manufacturer's production cost higher. [0003] In order to reduce production costs, TFT switching transistors are usually used as switches in the prior art to connect test lines and signal lines inside the display panel. During testing, a high voltage is applied to the gate (Gate) of the TFT switching transistor, and the switching transistor TFT is turned on. Test the signal and the signal line inside the display panel. After the test is completed, add...
Claims
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IPC IPC(8): G09G3/00
CPCG09G3/006G09G3/3648G09G3/3696G09G2330/04G09G2330/12
Inventor 杜鹏
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD