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Method for researching alloy baseband recrystallization and cubic texture forming mechanisms through quasi in-situ electron back scattered diffraction (EBSD) technology

A quasi-in-situ, planar sample technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problem of repeated testing of difficult samples

Active Publication Date: 2014-07-16
深创超导(深圳)科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the EBSD test, carbon tape is often used to fix the sample on the sample stage, but it is difficult to remove the sample intact for repeated tests

Method used

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  • Method for researching alloy baseband recrystallization and cubic texture forming mechanisms through quasi in-situ electron back scattered diffraction (EBSD) technology
  • Method for researching alloy baseband recrystallization and cubic texture forming mechanisms through quasi in-situ electron back scattered diffraction (EBSD) technology
  • Method for researching alloy baseband recrystallization and cubic texture forming mechanisms through quasi in-situ electron back scattered diffraction (EBSD) technology

Examples

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Effect test

Embodiment 1

[0020] The quasi-in-situ EBSD technique was used to study the formation mechanism of strong cubic texture at high temperature for u-Ni alloy substrate. Firstly, mark the surface of the studied sample by making a hardness test; secondly, fix the studied sample on the figure 1 On the sample table shown, the EBSD test was performed on the selected area; then, the test sample was taken out, and the heat treatment time was continued to be extended at 1000°C, and the EBSD test was performed on the selected area again; the same sample was tested several times according to the experimental analysis needs Repeat the heat treatment and perform multiple EBSD tests on the same area. Select the four pictures in the quasi-in-situ EBSD test result picture, such as image 3 As shown, the method of the present invention is capable of analyzing the formation mechanism of the cubic texture.

Embodiment 2

[0022] The quasi-in-situ EBSD technique was used to study the growth mechanism of recrystallized grains on Ni5W alloy substrate. Since the cross-section of the sample is only 80 μm, it is not suitable to mark the surface of the studied sample by hardness testing, so it is mainly positioned through the scale on the sample stage; first, the studied sample is heat-treated at 700 °C for 5 minutes, fixed at figure 2 On the sample stage shown, the EBSD test is performed on the selected area; then, the test sample is taken out, and the heat treatment time is continued to be extended at 700°C, and the EBSD test is performed on the selected area again. Select two pictures in the quasi-in-situ EBSD test result graph, such as Figure 4 As shown, the method of the present invention is capable of analyzing the recrystallization mechanism.

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Abstract

The invention discloses a method for researching an alloy baseband recrystallization and cubic texture forming mechanisms through a quasi in-situ electron back scattered diffraction (EBSD) technology and belongs to the field of research of texture alloy basebands of high-temperature superconducting coating conductors. Because conventional EBSD equipment cannot be heated at a high temperature, a mechanism for researching the alloy baseband recrystallization and cubic texture formation at high temperature by the in-situ EBSD technology is limited. The method provided by the invention is used for researching the alloy baseband recrystallization and cubic texture forming mechanisms through the quasi in-situ EBSD technology, and a sample stage for a quasi in-situ EBSD test is designed according to the difference (of planes or sections) of researched samples. According to the quasi in-situ EBSD technology, the novel method is provided for researching the alloy baseband recrystallization and cubic texture forming mechanisms.

Description

technical field [0001] The invention relates to a method for studying alloy base band recrystallization and cubic texture formation mechanism by quasi-in-situ EBSD technology, and belongs to the research field of textured alloy base band for high-temperature superconducting coating conductors. technical background [0002] Since the 1990s, electron backscattered diffraction (EBSD) technology for analyzing the orientation of crystal microdomains has made great progress and has been widely used in the characterization of the microstructure and texture of materials. At present, in the research on the textured alloy substrate for coated conductors, the usual method is to characterize the content of different textures under different heat treatment processes by EBSD technology to study the formation of the texture. However, the research methods commonly used at present cannot be well used for the study of the recrystallization and cubic texture formation mechanism of the alloy ba...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203
Inventor 索红莉田辉梁雅儒刘敏马麟王毅王盼孟易辰彭发学
Owner 深创超导(深圳)科技有限公司
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