Low-level sweep-frequency current testing system and testing method

A current test, low-level technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of environmental test personnel such as great harm and strong limitations, so as to avoid embargo problems, ensure universality, and scan The effect of low frequency electric field levels

Active Publication Date: 2014-07-16
陕西海泰电子有限责任公司
View PDF6 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the technical defects of existing sensitivity test methods such as strong limitations, great harm to the environment and test personnel, the p

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Low-level sweep-frequency current testing system and testing method
  • Low-level sweep-frequency current testing system and testing method
  • Low-level sweep-frequency current testing system and testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The specific implementation of the present invention will be further described below.

[0038] The principle that the present invention utilizes the low-level sweep frequency current test system to carry out the radiation sensitivity test of the electronic system under the HIRF environment is:

[0039] The induced current on the internal interconnection harness of the electronic system maintains linearity with the external field strength within a large dynamic range. In the frequency range of 0.2 ~ 400MHz, the electronic system is mainly disturbed by the external electromagnetic field through field line coupling. That is, the external electromagnetic field enters the system from the power port and signal port of the system by inducing current on the lead-out harness of the system to be tested. Therefore, in this frequency band, a low-level electric field can be used for frequency sweeping, and the coupling function of the radiation field strength and the induced curren...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a low-level sweep-frequency current testing system and a testing method which are used for radiated susceptibility test of an electronic system in an HIRF environment. The testing system is established by adopting an equivalent testing method, consists of a low-level sweep-frequency current main testing portion and a large-current injection main testing portion and comprises an electric field calibration device, a large-current testing device and a current injection device. The electric field calibration device is mainly used for measuring a low-level calibration electric field produced by a transmitting antenna, and a measurement result serves as a basis of BCM wiring harness current normalization. The large-current testing device is mainly used for calibrating sensing current on connected wiring harnessed inside the electronic system stimulated by the calibration electric field. The low-level sweep-frequency current testing system and the testing method can finish HIRF radiated susceptibility testing of larger complicated electronic systems including aircrafts, ships, warships and the like, the sweep-frequency electric field required by the testing is low in level, environmental pollution is low, no harm on testing persons is not produced, and the low-level sweep-frequency current testing system is low in cost and can solve the large-power power amplifier embargo problem.

Description

technical field [0001] The invention relates to the technical field of electromagnetic compatibility testing, and relates to a high-intensity electromagnetic radiation low-level frequency sweep current testing system and a testing method for an electronic system. Background technique [0002] With the development of science and technology, the electromagnetic environment problems caused by human activities are becoming more and more serious. Due to the radiation of high-power transmitters such as radar, radio, television, and satellite uplink data, high-intensity radiation fields (High Intensity Radiation Fields, HIRF) have become an important factor affecting the safety of electronic systems such as aircraft and ships. In 2006, the Civil Aviation Administration of China promulgated the information circular "Aircraft High Intensity Radiation Field (HIRF) Protection Requirements", which clearly stipulates that aircraft airworthiness certification must go through HIRF protecti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/00
Inventor 郭恩全陈晨杜浩赵乾
Owner 陕西海泰电子有限责任公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products