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Backup structure and backup method for WAT

A technology of backup structure and test machine, which is applied in the direction of software testing/debugging, generation of response errors, error detection of redundant data in hardware, etc. It can solve the problems of long switching time, affecting normal production of WAT, cumbersome operation, etc. problem, to achieve the effect of seamless docking

Active Publication Date: 2014-07-23
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this patent still has the problems of cumbersome operation and long switching time, which affects the normal production of WAT

Method used

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  • Backup structure and backup method for WAT

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0020] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0021] Embodiments of the present invention will be specifically explained below in conjunction with the accompanying drawings.

[0022] Such as figure 1 A WAT test backup structure of the embodiment of the present invention shown in , includes a main server 1 and several test machines 2 .

[0...

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Abstract

The invention provides a backup structure and backup method for a WAT. The backup structure comprises a main server, a plurality of testing machines and a backup server. The main server comprises a testing program. The testing machines are in communication connection with the main server, call the testing program in the main server and store testing data into the main server. The backup server is in communication connection with the main server and comprises a copying module, and the copying module copies the testing program in the main server and the stored testing data into the backup server. The backup server is in communication connection with the testing machines. When the main server breaks down, the testing machines call the copied testing program in the backup server and store the testing data into the backup server. According to the technical scheme, when a WAT server breaks down, the backup server can be automatically started to replace the main server, and therefore seamless joint of the main server and the backup server can be achieved, and WAT production can not be influenced.

Description

technical field [0001] The invention belongs to the field of semiconductors and relates to a WAT ​​(Wafer Acceptance Test) test, in particular to a backup structure and a backup method with a WAT ​​test. Background technique [0002] In order to achieve the consistency of each machine program in the WAT test, the WAT test program is stored on a server, and each machine is tested from the WAT server to call the program, and all WAT test data are also stored in WAT on the server. Therefore, the WAT server plays a vital role in the WAT test. Once the server fails, all WAT machines cannot be tested normally. [0003] At present, when the main WAT server has problems, it can only be manually switched to the backup server. The switching process is cumbersome and takes a long time, which will inevitably affect the normal production of WAT. [0004] Patent CN103336257A discloses a WAT ​​test system and method, the system includes: a management program establishment module, which i...

Claims

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Application Information

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IPC IPC(8): G06F11/16G06F11/36
Inventor 周波莫保章
Owner SHANGHAI HUALI MICROELECTRONICS CORP