In situ observation device and method of pitting forming process
An observation device and in-situ technology, which can be used in measurement devices, instruments, scanning probe microscopy, etc., and can solve the problems of in-situ dynamic observation of topographic features.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0023] The above-mentioned atomic force microscope 1 uses the Dimension Edge large sample stage atomic force microscope of Bruker, Germany;
[0024] The sample stage 2 is made of plexiglass with a diameter of 150mm and a thickness of 20mm, with three positioning pin holes;
[0025] The electrolytic cell bottom plate 4, the electrolytic cell cylinder 6, the upper cover plate 8 and the upper panel 10 are all made of organic glass, and the electrolytic cell bottom plate 4 contains three positioning pins 3;
[0026] The compression bolt 7, compression nut 9 and positioning pin 3 are made of stainless steel;
PUM
Property | Measurement | Unit |
---|---|---|
Diameter | aaaaa | aaaaa |
Thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com