System and method for I2C bus testing

A bus test and bus technology, applied in the field of I2C bus test system, can solve the problems of low test automation and inaccurate test results, and achieve the effect of high test automation and accurate test results

Inactive Publication Date: 2014-08-27
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the traditional test method, the parameters of the oscilloscope need to be manually set during the test process, and the test report needs to be manually filled out. The degree of test automation is not high, and the test results are not accurate.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System and method for I2C bus testing
  • System and method for I2C bus testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] see figure 1 , in a preferred embodiment of the present invention, a I 2 The C bus test system is used to test the I of a tested motherboard 300 2 Whether the signal transmitted by the C bus complies with the specification, the I 2 The C bus test system includes a test machine 100 and an oscilloscope 200 connected to the test machine 100 .

[0022] The tested motherboard 300 includes an I 2 C master control device 310 and a pass I 2 C bus with the I 2 C main control device 310 connected to the I 2 C slave device 320, the I 2 The C bus includes a serial data line 330 and a serial clock line 340 . In one embodiment, the I 2 C main control device 310 is a CPU (Central Processing Unit, central processing unit), the I 2 C slave device 320 is a memory, other I 2 C interface devices are also available through the I 2 A C bus is connected to the CPU. The oscilloscope 200 uses an oscilloscope probe to measure the signals transmitted by the serial data line 330 and a ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A system for I2C bus testing comprises an oscilloscope connected with an I2C bus of a tested mainboard. The oscilloscope is used for testing the waveform of signals transmitted on the I2C bus, the system for I2C bus testing further comprises a testing machine table, the testing machine table is connected with the tested mainboard and the oscilloscope and outputs test instructions to enable the I2C bus to start to transmit the signals and automatically adjust parameters of the oscilloscope, and a test report is automatically generated according to the waveform tested by the oscilloscope. The invention further discloses a testing method based on the system for I2C bus testing. The system and method for I2C bus testing are high in automation degree, and test results are accurate.

Description

technical field [0001] The present invention relates to a kind of I 2 C bus test system and method. Background technique [0002] I 2 C (Inter Integrated Circuit Bus, internal integrated circuit bus) bus interface, as a communication interface with convenient connection and simple structure, is currently widely used in integrated circuit design. I 2 The C bus is connected to the I 2 Information is transferred between devices on the C bus, and each device is identified by address. [0003] Traditional I 2 The C bus test method is to use an oscilloscope to measure the I 2 The signal waveform output by the C bus, and then compare the data carried by the measured waveform with the preset parameters, so as to judge the I 2 Whether the signal transmitted on the C bus meets the specification. However, in the traditional test method, various parameters of the oscilloscope need to be manually set during the test process, and the test report needs to be manually filled out, so...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
CPCG01R31/2801G01R31/2806G06F11/00G06F11/2221G06F11/273
Inventor 胡浩
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap