Current and voltage equalizing test method for SCR set and its device

A test method and technology of silicon unit, applied in the direction of measuring electricity, measuring device, measuring electrical variables, etc., can solve the problems of large power consumption of test equipment, difficult test work, lack of data basis, etc., and achieve a high degree of test automation, The effect of testing fast and time-consuming
CN1391108AInactive Publication Date: 2003-01-15胡振民
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
胡振民
Publication Date
2003-01-15
Estimated Expiration
Not applicable · inactive patent

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Abstract

An average current and voltage measuring method and equipment for SCR set is disclosed. The current and voltage equalizing coefficient of each bridge arm for SCR set is measured in intermittent pulse mode of pulse power supply, which is composed of average voltage measuring power supply and average current measuring power supply, both of which are switched by switch and relay. Two synchronizing transformers are used to provide synchronizing signals for synchronizing sampling with measuring. Its advantages are low cost, less electric consumption, and high measuring precision and speed.
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Description

technical field

[0001] The invention relates to a railway locomotive test method and its equipment, in particular to a silicon unit current and pressure equalization test method and its equipment. Background technique

[0002] my country's electric locomotive depot requires voltage equalization and current equalization tests for silicon units on electric locomotives after section repairs. Due to the small capacity of the test equipment, the test is more convenient, and most of the voltage equalization test can be carried out normally, while the current equalization test has some difficulties, mainly as follows: 1. The test equipment has a large capacity and the test consumes a lot of power; 2. The difficulty of the test work Large, poor working conditions; 3. When replacing components, there is insufficient data basis to select replacement components. In recent years, many units have made some improvements to the test device, using a single-chip microcomputer to record the ...

Claims

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