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Current and voltage equalizing test method for SCR set and its device

A test method and technology of silicon unit, applied in the direction of measuring electricity, measuring device, measuring electrical variables, etc., can solve the problems of large power consumption of test equipment, difficult test work, lack of data basis, etc., and achieve a high degree of test automation, The effect of testing fast and time-consuming

Inactive Publication Date: 2003-01-15
胡振民
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  • Application Information

AI Technical Summary

Problems solved by technology

Due to the small capacity of the test equipment, the test is more convenient, and most of the voltage equalization test can be carried out normally, while the current equalization test has some difficulties, mainly as follows: 1. The test equipment has a large capacity and the test consumes a lot of power; 2. The difficulty of the test work Large, poor working conditions; 3. When replacing components, there is insufficient data basis to select replacement components
In recent years, many units have made some improvements to the test device, using a single-chip microcomputer to record the current and print the report, improving the original manual clamp meter, and observing the backwardness of the reading, but none of them has solved the problems of large power consumption, high heat generation, and large investment.

Method used

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  • Current and voltage equalizing test method for SCR set and its device
  • Current and voltage equalizing test method for SCR set and its device

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Embodiment Construction

[0014] The present invention is described in detail in conjunction with the accompanying drawings. The equipment of the present invention includes a pulse power supply control circuit DYKZ, a low-voltage high-current pulse transformer T2, a high-voltage low-current pulse transformer T1, synchronous transformers T3 and T4, a trigger control circuit CF, and a high-speed data sampling circuit A. / D; self-inspection signal and I / O output control circuit XH, data acquisition and display circuit DSP, maximum and minimum current sharing coefficient tables Kmax, Kmin, voltage equalization output pulse voltage peak value table V, current average output pulse current peak value table I, support Circuit current peak table I1-I8.

[0015] The pulse power supply control circuit is composed of two independent voltage equalizing test power supplies and current equalizing test power supplies, which are interlocked and connected by a button switch. Connect synchronous transformers T3 and T4 an...

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Abstract

An average current and voltage measuring method and equipment for SCR set is disclosed. The current and voltage equalizing coefficient of each bridge arm for SCR set is measured in intermittent pulse mode of pulse power supply, which is composed of average voltage measuring power supply and average current measuring power supply, both of which are switched by switch and relay. Two synchronizing transformers are used to provide synchronizing signals for synchronizing sampling with measuring. Its advantages are low cost, less electric consumption, and high measuring precision and speed.

Description

technical field [0001] The invention relates to a railway locomotive test method and its equipment, in particular to a silicon unit current and pressure equalization test method and its equipment. Background technique [0002] my country's electric locomotive depot requires voltage equalization and current equalization tests for silicon units on electric locomotives after section repairs. Due to the small capacity of the test equipment, the test is more convenient, and most of the voltage equalization test can be carried out normally, while the current equalization test has some difficulties, mainly as follows: 1. The test equipment has a large capacity and the test consumes a lot of power; 2. The difficulty of the test work Large, poor working conditions; 3. When replacing components, there is insufficient data basis to select replacement components. In recent years, many units have made some improvements to the test device, using a single-chip microcomputer to record the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 胡振民
Owner 胡振民
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