A Method for Optical Detection and Microscopic Imaging of Micro-Nano Particles Unaffected by Background
A microscopic imaging and optical detection technology, which is applied to the analysis of materials and instruments, can solve the problems of difficult detection of non-metallic material particles, little change in refractive index, and submersion of small particle signals.
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[0022] The preferred embodiments will be described in detail below in conjunction with the accompanying drawings. It should be emphasized that the following description is only exemplary and not intended to limit the scope of the invention and its application.
[0023] The purpose of the invention is to detect and image micro-nano particles in the environment noise where large particles exist, and proposes an optical detection and micro-imaging method for micro-nano particles that are not affected by the background.
[0024] The method of the present invention is applied to a laser polarization heterodyne interference microscopic measurement device, which device includes a laser 1, a beam splitter 2, a beam expander 3, a beam expander 4, a polarization adjustment device 5, a polarization adjustment device 6, and an oil-immersion / water-immersion objective lens 7 , plated glass sheet 8, objective lens 9, mirror 10, acousto-optic modulator device 11, common beam splitting prism 1...
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Abstract
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