Pixel test circuit for AMOLED

A technology for testing circuits and pixels, applied in static indicators, instruments, etc., can solve problems such as increasing the cost of supporting equipment, and achieve the effect of reducing the number of independent probes and reducing costs

Active Publication Date: 2014-09-10
EVERDISPLAY OPTRONICS (SHANGHAI) CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Moreover, as the complexity of the circuit increases, the number of independent probes required may increase accordingly. Therefore, it may be necess

Method used

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  • Pixel test circuit for AMOLED
  • Pixel test circuit for AMOLED
  • Pixel test circuit for AMOLED

Examples

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Embodiment Construction

[0023] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[0024] In the following drawings, the same reference numerals are attached to the same or corresponding parts, and repeated descriptions will be omitted.

[0025] figure 2 yes means figure 1 The timing waveform diagram of the lighting control signal, the current scan signal and the front row scan signal of the pixel test circuit shown.

[0026] Such as figure 2 As shown, when the current scanning signal SN and the light-emitting control signal EN are both high level 1, the front row scanning signal SN-1 is low-level 0; when the current scanning signal SN is low-level 0, the light-emitting control signal EN is When the high level is 1, the front row scanning signal SN-1 is high level 1; when the current scanning signal SN is high level 1 and the light control signal EN is low level 0, the front row scanning signal SN-1 is high Level 1; when the current sc...

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Abstract

The invention provides a pixel test circuit for an AMOLED. The pixel test circuit comprises a pixel driving module and a NAND logic circuit module. A pixel driving circuit is connected with the power supply end, the data signal end, the current scanning signal end, the front row scanning signal end, the preset voltage end, the light-emitting control signal input end and the output end. Signals of the light-emitting control signal input end of the pixel driving module and signals of a current scanning signal input end serve as input signals of the NAND logic circuit module, and the output end of the NAND logic circuit module is connected with the front row scanning signal input end of the pixel driving module. According to the pixel test circuit for the AMOLED, when a TEG measuring machine table is utilized to perform measurement, the signals of the front row scanning signal input end do not need measuring, and accordingly the number of independent probes needed for measurement is reduced.

Description

technical field [0001] The invention relates to an AMOLED pixel test circuit, in particular to an AMOLED pixel test circuit which reduces the number of probes required for measurement. Background technique [0002] AMOLED (Active Matrix / Organic Light Emitting Diode: Active Matrix Organic Light Emitting Diode panel) is called the next generation display technology due to its faster response speed, higher contrast ratio, and wider viewing angle. [0003] In the current AMOLED products, the pixel circuit in the AA area generally adopts nTmC (n≥4, m≥1, m and n are positive Integer) structure, its circuit design is more complicated. Therefore, the process requirements are more stringent when designing high-resolution products. In order to monitor the product more timely and accurately, a test circuit (testkey) with test points corresponding to each component is usually set in the AMOLED product, and the parameters of each component are obtained by measuring each test circuit. ...

Claims

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Application Information

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IPC IPC(8): G09G3/32G09G3/00G09G3/3225
Inventor 董杭孙鲁男左文霞柯其勇
Owner EVERDISPLAY OPTRONICS (SHANGHAI) CO LTD
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