Preparation method of metal probe applicable to AFM (Atomic Force Microscope)

Abstract

The invention relates to a preparation method of a metal probe applicable to an AFM (Atomic Force Microscope). The method has the advantages of low cost, high success rate, wide probe tip application range and the like. The preparation method comprises the main steps as follows: firstly, performing electrochemical etching on metal wires, so as to obtain a probe tip with a sharp tail end; secondly, flattening metal wires close to the tail end of the probe tip by adopting silicon wafers or polycrystal sapphire pieces, wherein the flattened part is used as a suspension arm of an AFM probe; thirdly, bending the tail end of the probe tip by a certain angle, wherein the bent part is used as the probe tip of the AFM probe; fourthly, pasting the suspension arm on a specific substrate by using glue. The method can be used for manufacturing a metal probe made of various materials such as gold and silver, the tail end of the metal probe is sharp, the conductivity is excellent, and the preparation method is applicable to the AFM, various electrical measurement technologies (like an electrostatic force microscope) based on the AFM and a tip-enhanced Raman spectroscopy technology based on the AFM, and the like.

Description

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AI Technical Summary

Benefits of technology

This patented describes methods that improve the accuracy and efficiency of measuring tiny metals like Au nanoparticles. These small particles have unique characteristics - they allow them to absorb energy from incident radiation while transmitting signals through their surfaces. By applying voltage across these particles, changes occur when there're no absorption occurs. Using this process allows for precise measurements over long distances. Additionally, the inventors found that adding a special substances called hydrogen peroxide improves its effectiveness compared to other chemical agents commonly used during the production phase. Overall, these technical improvements result in improved precision and reliability in detecting minute quantities of noble metals.

Problems solved by technology

Technological Problem addressed in this patents relates to improving the performance of AFC probes due to their ability to create strong interactions without being affected by external forces like pressure waves. Current methods involve complicated processes involving multiple steps, leading to reduced accuracy and decreased reliabilities over time. Therefore, new ways to make AFO probes become increasingly useful in applications requiring both qualitative inspections at finer dimensions and quantitation capabilities.

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