Narrow-view-field star matching method based on error vector matching
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
- Publication Date
- 2014-11-05
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Abstract
Description
technical field
[0001] The invention belongs to the field of photoelectric measurement, in particular to a matching method for observing stars and star catalogs in the field of view of photoelectric equipment, in particular to a small field of view star matching method based on error vector matching. Background technique
[0002] In a large number of optoelectronic devices, it is necessary to use stars to calibrate or measure the device itself. For example, astronomical telescopes and photoelectric theodolites can calculate their own system errors by measuring the positions of stars, star sensors can navigate by identifying star maps, astronomical positioning systems can calculate the latitude and longitude of stations by photographing stars, and so on. In these applications, there is a common requirement, which is to know which stars in the known star catalog the stars observed in the field of view are, that is, to establish the corresponding relationship between the observ...