Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Narrow-view-field star matching method based on error vector matching

An error vector, matching method technique

Active Publication Date: 2014-11-05
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem solved by the present invention: Aiming at the problem that the number of stars observed by small-field photoelectric equipment is small at the same time, so that it is difficult to match the observed stars with the star catalog, a star matching method based on error vector matching is provided, which can be used for small-field Stellar Matching for Field Optoelectronic Devices

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Narrow-view-field star matching method based on error vector matching
  • Narrow-view-field star matching method based on error vector matching
  • Narrow-view-field star matching method based on error vector matching

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The following are specific implementation methods of the present invention. But following embodiment only limits to explain the present invention, and protection scope of the present invention should comprise the whole content of claim, and promptly can realize the whole content of claim of the present invention to those skilled in the art through following embodiment.

[0029] The first step of the present invention is to create a list of sub-stars to be matched with the current frame. Its purpose is to preliminarily delineate the stars to be matched, narrow the search range, and reduce the amount of subsequent calculations. Because the stars in the star catalog are recorded at the flat position of the star catalog, and the horizon coordinates of the field of view are known, if the search is performed directly, all the flat positions of the star catalog in the star catalog must be converted to the coordinates of the field of view, resulting in a large amount of calcula...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a narrow-view-field star matching method based on error vector matching. By aiming at the problem of matching difficulty between observed stars and a star catalog since a narrow-view-field optoelectronic device observes few stars in the same moment, a principle that the system error of the optoelectronic device is basically unchanged in a certain time and space range is utilized; recent historical frames of the optoelectronic device are combined; and the error vector accumulation effect is utilized for realizing the star matching of the narrow-view-field optoelectronic device. The narrow-view-field star matching method has the beneficial effects that the narrow-view-field star matching method can be applicable to the narrow-view-field optoelectronic device; the matching correctness is high; the requirements on image extraction and the star catalog are low; the parameter setting is simple; and real-time processing can be realized.

Description

technical field [0001] The invention belongs to the field of photoelectric measurement, in particular to a matching method for observing stars and star catalogs in the field of view of photoelectric equipment, in particular to a small field of view star matching method based on error vector matching. Background technique [0002] In a large number of optoelectronic devices, it is necessary to use stars to calibrate or measure the device itself. For example, astronomical telescopes and photoelectric theodolites can calculate their own system errors by measuring the positions of stars, star sensors can navigate by identifying star maps, astronomical positioning systems can calculate the latitude and longitude of stations by photographing stars, and so on. In these applications, there is a common requirement, which is to know which stars in the known star catalog the stars observed in the field of view are, that is, to establish the corresponding relationship between the observ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F19/00
Inventor 罗一涵陈科张涯辉钟代均
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com