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Accelerated life test over temperature alarm circuit

A technology of accelerated life and alarm circuit, applied in thermometers, measuring devices, measuring heat, etc., can solve the problems of high sample damage rate, reduce test efficiency and test accuracy, and achieve the goal of protecting samples, improving test efficiency and reducing damage rate Effect

Active Publication Date: 2017-06-16
SHENZHEN OCEANS KING LIGHTING ENG CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to overcome the shortcomings of the above-mentioned prior art, and propose an accelerated life test over-temperature alarm circuit, which can solve the problem that the life test in the prior art needs to be monitored by testers at all times, thereby reducing test efficiency and test accuracy. And the problem of high sample damage rate

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  • Accelerated life test over temperature alarm circuit

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Embodiment Construction

[0018] In order to further illustrate the principle and structure of the present invention, preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings.

[0019] see figure 1 , the accelerated life test overtemperature alarm circuit of the present invention includes: a detection unit 1 , a control unit 2 and an alarm unit 3 .

[0020] The detection unit 1 is used to detect the temperature of the test incubator, the control unit 2 is used to control the connection between the test lamp and the second power supply, and the alarm unit 3 is controlled by the control unit 2 . The detection unit 1 includes an input end and an output end, the input end of the detection detection unit 1 is connected to the first power supply, the control unit 2 includes a first input end, a second input end and an output end, and the first input end of the control unit 2 is connected to the first power supply. Power supply, the second inp...

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Abstract

The invention provides an accelerated life test over-temperature alarm circuit, which includes: a detection unit, which is used for detecting the temperature of a test temperature box, which includes an input end and an output end, and the input end of the detection and detection unit is connected to a first power supply; a control unit , which is used to control the connection between the test lamp and the second power supply, and includes a first input end, a second input end and an output end, the first input end of the control unit is connected to the first power supply, and the second input end of the control unit is connected to the detection The output end of the unit; the alarm unit, which is controlled by the control unit, and the alarm unit is connected to the output end of the control unit; wherein, when the detection unit detects that the temperature of the test temperature box exceeds the set test temperature, the control unit controls the test lamp and the The second power source is disconnected and the alarm unit is controlled to alarm. The invention can improve the test efficiency and precision, and reduce the sample loss rate.

Description

technical field [0001] The invention relates to an alarm circuit, in particular to an over-temperature alarm circuit for accelerated life testing. Background technique [0002] The lighting industry is widely used and important in modern society. The lighting products used in all walks of life are different. The purpose is to provide higher brightness to improve productivity and safety among production workers. Therefore, lighting quality requirements It is getting higher and higher, and the reliability requirements for lighting products are getting higher and higher. Especially for electronic products, their life is greatly affected by temperature stress and electrical stress. Therefore, according to the accelerated life test of electronic products, both driving and R&D lamps need to undergo accelerated life testing. Turn on the lamp, close the door of the test incubator, and the lamp will generate a lot of heat. If the test incubator cannot be kept at a constant temperatu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K1/02
Inventor 周明杰胡波
Owner SHENZHEN OCEANS KING LIGHTING ENG CO LTD