Accelerated life test over temperature alarm circuit
A technology of accelerated life and alarm circuit, applied in thermometers, measuring devices, measuring heat, etc., can solve the problems of high sample damage rate, reduce test efficiency and test accuracy, and achieve the goal of protecting samples, improving test efficiency and reducing damage rate Effect
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[0018] In order to further illustrate the principle and structure of the present invention, preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings.
[0019] see figure 1 , the accelerated life test overtemperature alarm circuit of the present invention includes: a detection unit 1 , a control unit 2 and an alarm unit 3 .
[0020] The detection unit 1 is used to detect the temperature of the test incubator, the control unit 2 is used to control the connection between the test lamp and the second power supply, and the alarm unit 3 is controlled by the control unit 2 . The detection unit 1 includes an input end and an output end, the input end of the detection detection unit 1 is connected to the first power supply, the control unit 2 includes a first input end, a second input end and an output end, and the first input end of the control unit 2 is connected to the first power supply. Power supply, the second inp...
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