A defect data analysis method and a method for using the same to reduce software testing items

A data analysis and defect technology, applied in the field of data analysis, can solve problems such as low credibility, immature analysis methods, and low efficiency, and achieve the effect of eliminating redundant information, improving efficiency and accuracy, and reducing the number of scales

Inactive Publication Date: 2016-12-07
ACADEMY OF ARMORED FORCES ENG PLA
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a method for analyzing the negative correlation between software defect data, which solves the problems of immature, low efficiency and low reliability of the existing negative correlation analysis method

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  • A defect data analysis method and a method for using the same to reduce software testing items
  • A defect data analysis method and a method for using the same to reduce software testing items
  • A defect data analysis method and a method for using the same to reduce software testing items

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Embodiment Construction

[0035] The specific implementation of the present invention will be described in detail below in combination with the defect data obtained by testing a common information management software.

[0036] The information software system is composed of 9 configuration items including comprehensive plan management software, personnel management software, and maintenance business management software, which jointly complete the organization, planning, coordination and other business work of information management. Each configuration item has a certain similarity in function and structure, but the target objects are different, which makes there is a certain correlation between the test defect data of the software. After a large number of tests are carried out on the software, a common information software system often has a software defect database. In this embodiment, the software defect data is obtained mainly through the software defect database.

[0037] Software defects can inclu...

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Abstract

The invention provides a defect data analytical method and a method for shortening software testing programs by using the defect data analytical method. The defect data analytical method provided by the invention comprises the following steps: constructing a defect data vector space model; calculating the similarity of the defect data; carrying out discretized coding of the defect data; simplifying a data matrix; obtaining chromosome congression; extracting a negative incidence relationship and the like. The method solves the problem that existing negative incidence relationship analytical method is immature, low in efficiency and reliability and the whole analytical process can be accomplished just by accessing a database at one time without frequently accessing the database. Based on the analytical method, the invention further provides a method for shortening software testing programs by using the defect data analytical method. By analyzing the negative incidence relationship, the method can be effectively helpful to testing personnel to screen the testing programs which are irrelevant to the defects, so that the efficiency of software test is further improved.

Description

technical field [0001] The invention relates to the field of data analysis, in particular to a defect data analysis method and a method for reducing testing workload by using defect data analysis. Background technique [0002] With the rapid development of software testing technology, various evaluation agencies have accumulated a large amount of high-dimensional and high-complexity software defect data through a large number of testing tasks. Making full use of these historical defect data and analyzing the correlation between them can effectively guide the subsequent software testing work, improve testing efficiency and reduce testing costs. [0003] At present, most of the analysis methods on the association relationship between software defect data study the positive association relationship, such as: Apriori algorithm and its improved algorithm, association rule mining method based on genetic algorithm, association rule mining method based on neural network, etc. These...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06N3/12
Inventor 万琳王钦钊范秋灵李小龙张威
Owner ACADEMY OF ARMORED FORCES ENG PLA
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