Hardware-in-loop test system and test method for ACC system development

Abstract

The invention discloses a hardware-in-loop test system and test method for an ACC system development. Actual test environment information is received through a test input interface, so that road traffic information as real as possible can be provided for system development, and meanwhile, test and evaluation for ACC control system execution link control instructions and vehicle hardware system response can be provided. The hardware-in-loop test system can provide a test bench capable of representing the real road traffic environment at an earlier stage of development of a self-adaptive cruise control (ACC) system, can carry out self-adaptive cruise control system development under the premise of reducing development cost and improving test security, is used for system control logic instruction functional development, is used for controller electrical performance test, can meet some special demands in the ACC system development, not only can help system development very well, but also can reduce development risk to a great extent.

Description

technical field [0001] The invention relates to a hardware-in-the-loop test system and test method for ACC system development. Background technique [0002] The development of vehicle electronic control systems usually adopts the V mode. In the V mode, the hardware-in-the-loop experiment is to use the virtual control object to test the control performance of the controller. With the increasing complexity of vehicle electronic control systems, its development difficulty is also increasing, and the role of hardware-in-the-loop experiments in the system development process is becoming more and more important. [0003] The adaptive cruise control system (ACC system) senses the environmental information in front of the vehicle (including roads, vehicles in front, obstacles, etc.) Control to avoid accidents and improve vehicle driving safety active safety control system. During the development process, a large number of tests are required to collect traffic conditions and analyz...

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a hardware-in-the-loop test system for ACC system development,

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