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Method and device for measuring structural parameters of CT system based on double-wire model

A system structure and parameter measurement technology, applied in measurement devices, instruments, computed tomography scanners, etc., can solve the problems of non-convergence and large amount of calculation.

Active Publication Date: 2017-01-11
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These methods have the following problems: the amount of calculation is large; iterations are required, and the iterative process does not converge for some parameters; some methods can only get part of the parameters; some methods are only suitable for linear arrays or area arrays; additional actions such as translation and lifting are required

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  • Method and device for measuring structural parameters of CT system based on double-wire model
  • Method and device for measuring structural parameters of CT system based on double-wire model
  • Method and device for measuring structural parameters of CT system based on double-wire model

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Embodiment 1

[0033] Embodiment 1 is the situation in which the first measurement method of the structural parameters of the CT system based on the double-filament model is measured for the area array detector cone-beam CT system in the present invention, combined below figure 1 Detailed description.

[0034]The CT system includes a ray source, a work turntable, and an area array detector. The work turntable is located between the ray source and the area array detector. The rotation center axis O of the work turntable is parallel to the imaging plane d of the area array detector. The focus s of the ray source is The plane where the central axis of rotation O is located is perpendicular to the imaging plane d of the area array detector; two wires A and B that are spaced apart from each other and parallel to each other are set on the double wire model; the measurement steps are:

[0035] 1) Install the double wire model on the working turntable in the CT system, make the two metal wires A and...

Embodiment 2

[0038] Embodiment 2 is the case where the first measurement method of the structural parameters of the CT system based on the double-filament model of the present invention is measured for the linear array detector CT system, which is basically the same as Embodiment 1, except that the area array detector and the linear array detector The shape of the imaging surface of the array detector is different, and the linear array detector is a strip imaging surface, so the rotation center axis O of the working turntable in embodiment 1 is parallel to the imaging surface d of the area array detector, while in embodiment 2 the ray The plane where the source focus s and the rotation center axis O are located is perpendicular to the strip imaging plane d of the line array detector.

Embodiment 3

[0040] Embodiment 3 is the situation that the second measurement method of the structural parameters of the CT system based on the double-filament model of the present invention is measured for the area detector cone-beam CT system, combined below figure 2 Detailed description.

[0041] The CT system includes a ray source, a work turntable, and an area array detector. The work turntable is located between the ray source and the area array detector. The rotation center axis O of the work turntable is parallel to the imaging plane d of the area array detector. The focus s of the ray source is The plane where the central axis of rotation O is located is perpendicular to the imaging plane d of the area array detector; two wires A and B that are spaced apart from each other and parallel to each other are set on the double wire model; the measurement steps are:

[0042] 1) Install the double wire model on the working turntable in the CT system, make the two metal wires A and B on t...

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Abstract

The invention discloses a double wire model-based CT system structure parameter measuring method and an apparatus thereof. The axis of a CT rotation center, the position of a reconstructed coordinate origin, a distance from a ray source to a detector, a distance from the ray source to the rotation center, the torsion angle of an area array detector, and other CT system structure parameters are calculated by obtaining the projection positions of two metal wires paralleling to a rotating shaft on the detector under the specific rotation position in a CT system and the relationship of the positions. The method is simple and practical, is suitable for the CT system of line array and area array detectors, can be used to obtain the CT system structure parameters and calibrate the CT system, and is helpful for improving the reconstructed CT image quality.

Description

technical field [0001] The invention relates to a method and device for measuring structural parameters of a CT system, in particular to a method and device for measuring structural parameters of a CT system based on a double-wire model, and belongs to the technical field of CT. In this method, a device including two parallel wires is used to fix the device on the turntable in such a way that the wires are parallel to the rotation axis of the CT turntable. The projection position and position relationship on the scanner, and the geometric structure parameters of the CT system are obtained through calculation. The method is simple and practical, and can be used for acquisition of structural parameters of the CT system and adjustment of the CT system, and helps to improve the quality of CT image reconstruction. Background technique [0002] CT (Computed Tomography) is a radiation imaging non-destructive testing technology commonly used in medical and industrial fields. Wheth...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/00A61B6/03
Inventor 刘锡明吴志芳苗积臣丛鹏童建民
Owner TSINGHUA UNIV