Multi-channel symmetric calibration method of integrated circuit testing system and interface switching device of integrated circuit testing system

Abstract

The invention provides a multi-channel symmetric calibration method of an integrated circuit testing system and an interface switching device of the integrated circuit testing system. With the number of calibration channel interfaces of the integrated circuit testing system as the benchmarke, the channel interfaces of the integrated circuit testing system are divided into groups in sequence, and the number of types of each group of testing channel interfaces is made to be exactly identical with the number of the channel interfaces of each type; meanwhile, type arrangements of each group of the testing channel interfaces are exactly the same; the calibration channel interfaces sequentially calibrate each group of the testing channel interfaces until all the testing channel interfaces are calibrated. The channel interfaces of the integrated circuit testing system are divided into the groups and are calibrated in group, therefore, thousands of the channel interfaces of the integrated circuit testing system can be accurately switched, massive switching matrixes and module switching matrixes are shortened, and the anti-interference capacity is improved.

Description

technical field [0001] The invention relates to a calibration method, in particular to a method for multi-channel symmetrical calibration of an integrated circuit testing system and an interface conversion device thereof. Background technique [0002] The current multi-channel calibration of integrated circuit test systems mainly uses matrix switching instruments for intermediate connection and mapping, connecting one-channel or multi-channel calibration devices to each channel of integrated circuit test systems with hundreds or thousands of channels, and calibrate it. The calibration unit of one or more channels contained in the calibration device can be connected to any channel of the integrated circuit test system through switching. However, with the rapid development of the scale of integrated circuit pins, the channel scale of integrated circuit test systems is getting larger and larger. The existing matrix switching instruments are far from being able to meet the cali...

AI Technical Summary

Problems solved by technology

However, with the rapid development of the scale of integrated circuit pins, the channel scale of integrated circuit test systems is getting larger and larger. The existing matrix switching instruments are far from being able to meet the calibration of large-scale integrated circuit test systems. An instrument that meet

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