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Method of operating testing system

A detection system and detection machine technology, applied in the field of detection systems, can solve problems such as easy errors and inaccurate test results

Inactive Publication Date: 2015-06-17
MPI CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method of operation is only performed at the initial stage of the test, and when the probe is replaced in response to different test requirements, the initial detection value is still used for compensation, which is prone to errors, resulting in inaccurate test results

Method used

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  • Method of operating testing system

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0026] Please refer to figure 1 As shown, the detection system includes a detection machine 10 and a probe module 30 electrically connected in sequence, the detection machine 10 is provided with a coaxial wire 12, and one end of the wire 12 is provided with a male connector made of a conductor 121. The probe set 30 then includes a first probe set 34a and a second probe set 34b with different measuring distances, and the first probe set 34a and the second probe set 34b are respectively provided with a Formed female connectors 341, 342. In this way, the detector 10 can connect the male connector 121 on the wire 12 with the female connectors 341, 342 on the first probe set 34a or the second probe set 34b according to the d...

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Abstract

A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.

Description

technical field [0001] The invention relates to a detection system, in particular to an operation method of the detection system. Background technique [0002] Press, with the development of electronic products is becoming more and more vigorous, in order to ensure the quality of electronic products when they leave the factory, before manufacturing, assembling and leaving the factory, the detection system is usually used to detect whether the electrical connection between the precision electronic components of electronic products is correct. [0003] In order to make the detection more accurate, after the detection system assembles the probe set, the probes will first be abutted against a calibration sheet to compensate the detection value (for example, return to zero). However, this method of operation is only performed at the initial stage of the test, and when the probe is replaced according to different test requirements, the initial detection value is still used for com...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R35/00
CPCG01R31/2891G01R35/005
Inventor 顾伟正吕绍玮魏豪王友泽
Owner MPI CORP
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