Polycrystalline X-ray Diffraction-Photocatalysis Combined In Situ Characterization Analysis System

Abstract

The invention relates to a polycrystalline X-ray diffraction-photocatalysis combination in situ characterization analysis system. The system comprises a polycrystalline X-ray diffractometer, a gas chromatograph, a solar simulator and a photocatalysis reactor arranged on the sample bench of the polycrystalline X-ray diffractometer, and the photocatalysis reactor is composed of a sample rack and a housing connected with the sample bench; the housing comprises a stainless steel hollow cylinder and a stainless steel baseboard connected with the bottom of the cylinder, and the cylinder is provided with a window, a gas inlet and a gas outlet; the window is arranged at the right top of the cylinder and extends to two sides of the cylinder; the gas inlet is connected with a gas bottle arranged outside the polycrystalline X-ray diffractometer through a pressure-reducing valve and a gas flowmeter, and the gas outlet is connected with a sample introduction system of the gas chromatograph arranged outside the polycrystalline X-ray diffractometer through a gas flowmeter; and the solar stimulator is arranged in the polycrystalline X-ray diffractometer, and the fiber port of the solar simulator is positioned over the window of the photocatalysis reactor. The system solves the in situ analysis problem of the crystal change of a semiconducting material in the photocatalysis reaction process.

Description

technical field [0001] The invention relates to an online analysis and testing system for photocatalytic materials, in particular to a polycrystalline X-ray diffraction-photocatalytic in-situ characterization analysis system that can realize the phase transition of photocatalytic materials under the condition of on-line detection of light. Expansion of the in situ capabilities of the diffractometer. Background technique [0002] Polycrystalline X-ray diffraction analysis (X-ray diffraction) can accurately conduct qualitative and quantitative analysis of polycrystalline powder materials, and is applied to the stripping of overlapping peaks, calculation of unit cell parameters, determination of crystallization system, crystal particle size and lattice stress calculation, calculation of crystallinity, etc. The polycrystalline X-ray diffraction method has the advantages of no damage to the sample, no pollution, fast, high measurement accuracy, and a large amount of information ...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem that the existing polycrystalline X-ray diffractometer cannot perform synchronous in-situ analysis on the crystal changes of semiconductor materials during the photocatalytic reaction, the present invention designs a polycrystalline X-ray diffractometer on the basis of the existing polycrystalline X-ray diffractometer. In situ characterization and analysis system combined with ray diffraction-photocatalysis, which further expands the function of in situ characterization and analysis of polycrystalline X-ray diffractometer

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