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Method for Measuring Availability and Related Devices

A technology of equipment and time, applied in the field of detection, can solve the problems of large amount of recorded information, unclear equipment failure time period, complicated conversion, etc., to achieve the effect of simple conversion, clear failure time period, and accurate calculation

Active Publication Date: 2019-06-18
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This technology needs to record the mean time between failures and the mean time to repair between failures of the system and modules, the amount of recorded information is large, the time period of equipment failure is not clear, and the conversion is complicated

Method used

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  • Method for Measuring Availability and Related Devices
  • Method for Measuring Availability and Related Devices
  • Method for Measuring Availability and Related Devices

Examples

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Embodiment Construction

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] refer to figure 1 , a method for measuring availability provided by the first embodiment of the present invention, comprising:

[0042] S101. Record the time when the device fails and the time when it recovers from the failure.

[0043] If the equipment as a whole fails, it will not be able to provide the required functions, the equipment will enter the fault state, report the fault alarm of the device, and record the fault occurrence time and fault re...

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Abstract

The present invention relates to a method for measuring availability. The method for measuring availability includes : the failure occurring time and the failure recovery time of a device are recorded; the downtime of a year is calculated according to the failure occurring time and the failure recovery time; and the availability of the device is calculated according to the downtime of a year. The method for measuring availability calculates the failure duration and the downtime of a year according to the failure occurring time and the failure recovery time; then the availability of the device can be calculated according to a formula; and therefore, the recording information is easy to read and is relatively little, the failure time period is clear and the conversion is simple, so that the measurement efficiency of the availability is increased.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to a method and a related device for measuring availability. Background technique [0002] With the continuous increase of the capacity and capability of controller network elements, more and more operators have raised concerns and doubts about the reliability of wireless access networks, and proposed that important network The demand for the overall monitoring of the dimensional network makes it urgent to measure the stability of the equipment. Device stability includes measures of availability and events that cause device instability. [0003] At present, the method of calculating the availability is generally to manually record the normal operation time and the time in the failure period after the equipment is put into use, and obtain the mean time between failure (MTBF) and the mean recovery time of the equipment. Time (mean time to repair, MTTR for short), and then calculat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/24H04L12/26
CPCH04L41/0654H04L41/0695H04L41/14H04L43/0805
Inventor 王姗姗
Owner HUAWEI TECH CO LTD
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