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A Fault Diagnosis Method for Analog Circuits with Single Measurement Node

A technology for simulating circuit faults and diagnostic methods, applied in the direction of simulating circuit testing, measuring electricity, measuring electrical variables, etc., can solve the problem that the circuit cannot directly apply the characteristic factor of blind source separation technology

Active Publication Date: 2017-08-25
HEFEI UNIV OF TECH
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Problems solved by technology

Therefore, the circuit with a single measurement node cannot directly apply the blind source separation technology to extract the characteristic factor

Method used

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  • A Fault Diagnosis Method for Analog Circuits with Single Measurement Node
  • A Fault Diagnosis Method for Analog Circuits with Single Measurement Node
  • A Fault Diagnosis Method for Analog Circuits with Single Measurement Node

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Embodiment Construction

[0034] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0035] refer to figure 1 , a single measurement node analog circuit fault diagnosis method, comprising the following steps:

[0036] (1) Obtain the prior sample data vectors under each failure mode: use computer simulation software to obtain each failure mode F of the analog circuit to be tested i M groups of voltage sample vector V under ij , i=1,2,...,N, j=1,2,3,...,M, where N is the total number of circuit failure modes, i represents the circuit working in the i-type failure mode, and j is the collected jth group sample, V ij Represents the jth group of voltage sample vectors collected under the i-type failure mode of the circuit. exist figure 1 where is expressed as: collecting the voltage sample vectors under the first category failure mode of M groups; collecting the voltage sample vectors under the second category failure mode of M groups; ...;

[0037] ...

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Abstract

A single measurement node analog circuit fault diagnosis method, comprising the following implementation steps: (1) Acquiring prior sample data vectors under each fault mode; (2) Calculating the statistical average value of the prior sample vectors under each fault mode; ( 3) Haar orthogonal wavelet filter bank decomposition of signal; (4) Extraction of characteristic factors of failure mode of prior samples; (5) Extraction of characteristic factors of failure mode to be tested; (6) Calculation of characteristic factors of failure mode to be tested and prior samples The cross-correlation coefficient matrix between the characteristic factors of the failure mode, and the correlation degree measurement parameters (7) Compare the correlation degree measurement parameters, and judge the failure mode according to the principle of maximum correlation. The invention can convert a single-channel signal into a multi-channel signal without losing the original measurement information, extract the characteristic factor of failure mode independence, and make it reflect the change of the circuit structure under different failure modes, and then study the relevant modes Decision rules to complete the successful classification of circuit failure modes.

Description

technical field [0001] The invention relates to a fault diagnosis method for a single measuring node analog circuit. Background technique [0002] Fault diagnosis of analog circuits is essentially equivalent to the problem of pattern recognition, and the key lies in the search for the relationship between feature extraction and pattern criterion functions. Therefore, how to find the potential fault characteristic factors from the seemingly complicated measurement data, and use this as a basis to correctly judge and identify the fault mode is an important research topic in the field of analog circuit testing. [0003] Fault diagnosis of analog circuits has been developed for decades, and there are various achievements in this field, and new research results are constantly emerging. Summarizing the various techniques used in the fault diagnosis process, the widely used ones are mainly the fault feature extraction method based on statistical theory and wavelet analysis, the fa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/316
CPCG01R31/3161G01R31/316
Inventor 袁莉芬吴磊何怡刚孙业胜张朝龙龙英程珍袁志杰赵德勤
Owner HEFEI UNIV OF TECH
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