A frequency test method and corresponding frequency test system
A test method and test system technology, applied in the field of frequency meter design, can solve the problems of inaccurate test results and the inability of the frequency test system to adjust the frequency division ratio adaptively, and achieve automatic switching, improve measurement accuracy, and expand the test range. Effect
Inactive Publication Date: 2018-05-04
HENAN UNIV OF SCI & TECH
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Problems solved by technology
[0005] The purpose of the present invention is to provide a frequency test method and a corresponding frequency test system to solve the problem that the frequency test system in the prior art cannot adaptively adjust the frequency division ratio, resulting in inaccurate test results
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[0021] Example of Frequency Test Method
[0022] The frequency testing method of the embodiment of the present invention comprises the following steps:
[0023] (1) Test the signal to be tested, calculate the test cycle of the signal to be tested; judge whether the test cycle is less than the set value; when the test cycle is greater than or equal to the set value, take the reciprocal of the test cycle to generate the frequency of the signal to be tested value; when the test period is less than the set value, proceed to the next step;
[0024] The timer of the one-chip computer counts the signal to be tested, and calculates the test cycle according to the overflow times and the count value. The single-chip microcomputer judges whether the test period is less than the set value; when the test period is greater than or equal to the set value, the test period is reciprocated to obtain the frequency value of the signal to be tested; when the test period is less than the set value...
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The present invention relates to a frequency testing method and a corresponding frequency testing system, including a single-chip microcomputer and a programmable frequency divider, the single-chip microcomputer controls and connects the programmable frequency divider, and is used to control the frequency division of the programmable frequency divider ratio; the programmable frequency divider is used to connect the signal to be tested; the output of the programmable frequency divider is connected to the single-chip microcomputer; it is used to output the signal to be tested after frequency division to the single-chip microcomputer for testing. The signal to be tested is judged by the single-chip microcomputer, and the frequency division ratio is adaptively adjusted, and then the signal to be tested is divided by f1 and f2 through the programmable frequency divider to increase the measurement period of the signal to be tested , until the signal to be tested is expanded to a suitable range (greater than or equal to the set value), and then tested by a single-chip microcomputer, so that the frequency test system of the present invention can realize automatic switching of the frequency division ratio, which improves the measurement accuracy and expands the Test Range.
Description
technical field [0001] The invention belongs to the field of frequency meter design, and in particular relates to a frequency test method and a corresponding frequency test system. Background technique [0002] With the development of the electronic information industry, the signal is its most basic element, and its frequency measurement plays an increasingly important role in scientific and technological research and practical applications, and the range of frequency measurement required is getting wider and wider. There are many ways to measure frequency, which are mainly divided into two categories: analog method and digital method. The traditional analog frequency test method usually uses a large number of hardware circuits such as combination circuits and sequential circuits for frequency measurement. The product is not only large in size, but also runs The speed is slow, and the measurement range is low, and the accuracy is low. Therefore, with the improvement of the ...
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IPC IPC(8): G01R23/02
Inventor 张海涛曹锋徐兴元李晓强
Owner HENAN UNIV OF SCI & TECH