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Test handler

A technology for testing sorting machines and electronic components, applied in sorting, measuring electricity, measuring devices, etc., can solve problems such as limiting the thermal management efficiency of electronic components, and achieve the effect of reducing temperature deviation and improving efficiency

Active Publication Date: 2015-12-23
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the management efficiency of thermal management of electronic parts is limited (from the viewpoint of miniaturization of the entire device, it is advantageous to form the inlet at the upper part)

Method used

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Embodiment Construction

[0035] Hereinafter, embodiments of the technical concept according to the present invention will be described in detail with reference to the accompanying drawings. In the following description, well-known functions and / or constructions will not be described in detail if they may unnecessarily obscure the features of the present invention.

[0036] A test sorter according to an embodiment of the present invention may include a loading unit, a soaking chamber, a testing chamber, a desoaking chamber, a circulation unit, and an unloading unit. The above configuration is based on figure 1 A detailed description is given. Therefore, repeated explanations will be omitted in the following description, and differences from the above configuration, the desoaking chamber, and the circulation unit will be described with priority.

[0037] and according to about figure 2Similar to the desoaking chamber of the prior art test handler described, the desoaking chamber of the test handler ...

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Abstract

An embodiment of the invention provides a test handler. The test handler includes: a loading unit for loading electronic components; a soaking chamber for pre-cooling or pre-heating of the loaded electronic components in order to allow the loaded electronic components to have a preset temperature; a test chamber for testing the pre-cooled or pre-heated electronic components; soaking removing chamber for recovering the temperature of the tested electronic components to a preset level, wherein the soaking removing chamber includes a flow path providing with a first inlet, outlet and a second inlet near the outlet, and formed in an inner part of a side wall of the soaking removing chamber; a circular unit for cycling air in the soaking removing chamber along the flow path; an unloading unit for unloading the electronic components which is recoved to the temperature of the preset level.

Description

technical field [0001] The present invention relates to test handlers. Background technique [0002] A test sorter is a device that supports testing for electronic components such as semiconductor devices manufactured through a predetermined manufacturing process, sorts electronic components into grades based on test results, and loads the sorted electronic components on customer on the tray. [0003] figure 1 It is a plan view of a test sorter 300 (hereinafter simply referred to as prior art) according to Korean Patent Publication No. 10-2013-0105265 filed by the applicant. Referring to the drawings, the test sorter 300 may be configured to include a loading unit 320 , a soaking chamber 330 , a de-soaking (de-soaking) chamber 350 , and an unloading unit 380 . [0004] The test tray 310 may include a plurality of inserts in which electronic components may be securely placed and circulated along a closed path C defined by a plurality of transport systems (not shown). [0...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/00B07C5/02
CPCG01R31/2862G01R31/2867G01R31/2874G01R31/2893H01L21/677
Inventor 金斗佑金峻秀金成元
Owner TECHWING CO LTD