A Reliability Modeling Method of Circuit Module Failure Mechanism Correlation Based on Petri Net
A technology of fault mechanism and correlation, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as inability to reflect the dynamic characteristics of the system, and achieve the effect of reducing test costs and improving efficiency
Active Publication Date: 2018-05-11
BEIHANG UNIV
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[0013] The purpose of the present invention is to provide a reliability modeling method based on the Petri net-based circuit module failure mechanism correlation relationship for existing electronic products, especially the failure mechanism correlation modeling of circuit modules.
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[0063] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The invention provides a reliability modeling method based on the Petri net to the correlation relationship of the failure mechanism of the circuit module.
[0064] Table 1 gives the main elements that constitute Petri nets and their functional descriptions in reliability modeling of circuit modules.
[0065] Table 1 Main elements and function description of Petri net
[0066]
[0067]
[0068] In order to further illustrate the structural characteristics of Petri nets, figure 1 An example diagram of a typical Petri net structure in reliability modeling of circuit modules is given. Wherein, the specific meanings of the reference numbers in the accompanying drawings are as follows:
[0069] The reference number 1 refers to the M1 storehouse, which here indicates the development state of the failure mechanism M1.
[0070] The reference n...
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The invention provides a Petri net-based modeling method for the correlation relationship between the failure mechanism of the circuit module, divides each sub-module according to the circuit module, and determines the failure mechanism and the correlation relationship of the failure mechanism of each sub-module; establishes according to the failure mechanism and the correlation relationship of the failure mechanism The local model of the fault mechanism correlation relationship corresponding to each sub-module; according to the circuit logic relationship between the sub-modules, the partial models of the multiple fault mechanism correlation relationships obtained above are integrated into the overall model of the fault mechanism correlation relationship; the fault mechanism correlation Reliability simulation analysis of the partial model of the relationship and the overall model of the failure mechanism correlation. The modeling method of the present invention improves the reliability analysis efficiency of the circuit module after modeling, and at the same time, by using the dynamic characteristics of the Petri net, the fault information of the circuit module and its flow are fully described, providing more reliability analysis for the circuit module Accurate failure mechanism correlation model.
Description
technical field [0001] The invention relates to the field of design product reliability modeling, in particular to a reliability modeling method based on Petri net-based circuit module failure mechanism correlation. Background technique [0002] The process of building a system model is also called modeling. Modeling is an important means and premise of studying the system. Any process that uses a model to describe the causal relationship or mutual relationship of a system belongs to modeling. Because the relationship described is different, the means and methods to realize this process are also various. It can be modeled according to the mechanism of things through the analysis of the law of motion of the system itself; it can also be modeled according to the existing knowledge and experience about the system through the processing of experimental or statistical data of the system. It is also possible to use several methods at the same time. [0003] At present, in the ...
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IPC IPC(8): G06F17/50
Inventor 陈颖李颖异汤宁
Owner BEIHANG UNIV