Unlock instant, AI-driven research and patent intelligence for your innovation.

Printed circuit board inspection device and inspection method

A technology for printing substrates and inspection devices, which is applied in the directions of measuring devices, instruments, measuring electricity, etc., can solve problems such as inability to detect signals reliably, and achieve the effects of accurate inspection, reliable detection of signals, and stable current.

Active Publication Date: 2018-05-08
YAMAHA FINE TECHNOLOGIES CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, in any of the methods described in the above-mentioned patent documents, the probes for detecting electrical signals are arranged in a non-contact manner with the conductor pattern, and are not directly in contact with the conductor pattern. Therefore, it may not be possible to reliably detect the signal.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Printed circuit board inspection device and inspection method
  • Printed circuit board inspection device and inspection method
  • Printed circuit board inspection device and inspection method

Examples

Experimental program
Comparison scheme
Effect test

no. 1 Embodiment approach

[0065] Such as figure 1 as well as figure 2 As shown, the printed circuit board inspection apparatus 11 in the first embodiment inspects a plurality of conductor patterns E1 to E4 of the printed circuit board 1. The printed circuit board inspection apparatus 11 has: a constant current source 12 that generates a predetermined current; The first probes P1-P4 are respectively in direct contact with one ends of the conductor patterns E1-E4 exposed on the printed circuit board 1; the plurality of second probes P5-P8 are respectively in contact with the conductor patterns E1-E4 The other end of E4 is in contact; the first connecting device 14 has a plurality of switches A1-A4 for connecting each of the first probes P1-P4 with the constant current source 12 respectively; the second connecting device 15 has A plurality of switching switches B1-B4 for respectively connecting the second probes P5-P8 with the reference potential (usually ground potential) of the constant current source...

no. 2 Embodiment approach

[0090] Figure 8 as well as Figure 9 A printed circuit board inspection device 31 according to the second embodiment is shown. In this printed circuit board inspection device 31 , between the second probes P5 to P8 and the switching switches B1 to B4 of the second connection device 15 are provided with predetermined capacitors, respectively. The capacitors C1 ~ C4.

[0091] In this second embodiment, other configurations are the same as those of the first embodiment, and therefore the same reference numerals are assigned and descriptions thereof are omitted. In addition, the printed circuit board inspection method realized by the printed circuit board inspection device 31 of the second embodiment is the same as image 3 The case of the first embodiment shown is the same, and although the absolute values ​​and the like are different with respect to the temporal change states of the potentials of the first probes P1 to P4, they are the same as Figure 4 ~ Figure 7 The case o...

no. 3 Embodiment approach

[0094] Figure 10 as well as Figure 11 The printed circuit board inspection device 41 of the third embodiment is shown. In the above-mentioned second embodiment, capacitors C1 to C4 are provided between the second probes P5 to P8 and the switches B1 to B4 of the second connecting device 15, respectively. On the other hand, in this printed circuit board inspection device 41 , capacitors C5 to C8 having predetermined capacitances are respectively provided between the switching switches B1 to B4 of the second connection device 15 and the reference potential of the constant current source 12 . Only the positions where these capacitors C5 to C8 are provided are different from the second embodiment, and the other configurations are the same as those of the second embodiment.

[0095] Therefore, in the third embodiment, the change in capacitance when the second connection device 15 is operated can be increased by providing the capacitors C5 to C8 between the second connection devic...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a printed circuit board inspection device, which is an electrical inspection device for a printed circuit board, and applies an electrical signal to a conductor pattern formed on a printed circuit board to check whether the conductor pattern is good, wherein the printed circuit board inspection device includes: a first probe, It is in contact with one end of the conductor pattern; the second probe is disposed on the other end of the conductor pattern via an insulator; a constant current source; a first connection device for connecting the first probe to the constant current source; a second connection device , which is used to change the electrical connection state of the second probe relative to the reference potential of the constant current source; and a measurement circuit, which is used to measure the potential of the first probe relative to the reference potential of the constant current source.

Description

technical field [0001] The present invention relates to a device and an inspection method for inspecting the electrical state of a conductor pattern on a printed circuit board. [0002] This application claims priority based on Japanese Patent Application No. 2014-153493 for which it applied in Japan on July 29, 2014, and uses the content here. Background technique [0003] When inspecting electrical conditions such as disconnection of a conductor pattern on a printed circuit board, an inspection probe is usually brought into contact with both ends of the conductor pattern to conduct a continuity test. However, there may be cases where one end of the conductor pattern is covered with an insulating film. In some cases, or when a touch panel or the like is formed, the inspection probe cannot be brought into direct contact with the conductor pattern. In such a case, as disclosed in Patent Document 1 and Patent Document 2, the inspection is performed with the inspection probe n...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/02
Inventor 土田宪吾三宅康志
Owner YAMAHA FINE TECHNOLOGIES CO LTD