Measurement area compensation method when inspecting substrates
A compensation method and area technology, applied in the direction of measuring devices, image enhancement, instruments, etc., can solve the problem of increased failure rate and achieve the effect of improving reliability
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[0056] Just refer to the attached Figure 1 With multiple embodiments described in detail, it is possible to clearly understand the purpose, effect and technical structure for realizing the present invention. In describing the present invention, when it is judged that a specific description of a known function or structure will unnecessarily obscure the gist of the present invention, the detailed description will be omitted. In addition, a plurality of terms described later are terms defined in the present invention in consideration of structure, action, function, and the like, and may vary depending on the user's or operator's intention or custom.
[0057] However, the present invention is not limited to the plurality of embodiments disclosed below, but can be embodied in various forms different from each other. However, this embodiment is only provided to make the disclosure of the present invention more complete and to enable those of ordinary skill in the art to fully und...
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