Resistive sensor array test circuit, test method, and sensor system

Abstract

The invention discloses a resistive sensor array test circuit based on two-wire system voltage feedback, and belongs to the technical field of a sensor. The circuit is applied to an M*N two-dimensional resistive sensor array sharing row wires and column wires. The test circuit comprises a voltage feedback operation amplifier, a row multipath selector, a column multipath selector, a sampling resistor, a reference voltage source, N column wire driving operation amplifiers in one-to-one correspondence with N column wires of the resistive sensor array, and two connecting wires respectively arranged for each row wire and each column wire of the resistive sensor array. The invention also discloses a test method of the test circuit, and a sensing system. Compared to the prior art, a two-wire system voltage feedback method is taken as a key technology, measurement errors caused by connection with a cable lead wire resistor, a cable joint contact resistor and a multipath switch channel conduction resistor can be effectively eliminated, and the measurement precision of the resistive sensor array is substantially improved.

Description

technical field [0001] The invention relates to the technical field of sensors, in particular to a resistive sensor array testing circuit. Background technique [0002] The array sensing device is to combine multiple sensing elements with the same performance according to the structure of a two-dimensional array. It can change or generate corresponding shapes and characteristics by detecting changes in parameters focused on the array. This feature is widely used in biosensing, temperature tactile and thermal imaging based on infrared sensors, etc. [0003] Resistive sensor arrays are widely used in infrared imaging simulation systems, force tactile sensing and temperature tactile sensing. Taking temperature touch as an example, since the temperature sensing device involves the transfer of heat and the perception of temperature, in order to obtain the thermal properties of the object, the device puts forward higher requirements for the temperature measurement accuracy and re...

AI Technical Summary

Problems solved by technology

Lead resistances with basically the same resistance and contact resistances with different resistances have a significant impact on the test accuracy of the resistive sensor array

As far as the shared row and column resistive sensor array based on the voltage feedback method is concerned, the lead resistance and contact resistance lead to the potential difference between the feedback driving end of the test circuit and the driving end of the resistive sensor array module, and also lead to the difference between the sampling end of the test circuit and the driving end of the resistive sensor array module. The potential difference between the sampling terminals of the resistive sensor array module destroys the ideal isolation feedback condition of the test circuit and increases the resistance measurement error of the unit under test

Therefore, basically the same lead wire resistance and different cable connector contact resistance have a significant impact on the test results of the shared row and column resistive sensor array based on the voltage feedback method. How to eliminate the influence of these factors is a problem to be further studied

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