Method and equipment for measuring particle size of flat glass surface
A technology for measuring glass surface and flat plate, applied in measuring devices, optical testing flaws/defects, instruments, etc., can solve problems such as reduction, poor dimensional detection accuracy, and inaccurate measurement
Active Publication Date: 2020-05-01
DONGXU OPTOELECTRONICS TECH CO LTD
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At the same time, although the above method can identify particles of 1um, the detection accuracy of the size is extremely poor
[0003] At the same time, with the advancement of technology, the liquid crystal glass substrate is developing towards a thinner direction. Due to the improvement of resolution, the user's tolerance for the particles on the surface of the glass substrate is decreasing. When the particle size is lower than 1um, the light scattering method is used. cannot be accurately measured
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[0036] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0037] figure 1 A flow chart of the method for measuring the surface particle size of flat glass provided by the present invention is shown. Such as figure 1 As shown, the method for measuring the particle size of the flat glass surface includes steps S10-S30.
[0038] Step S10: forming a first illuminated strip and a second illuminated strip parallel to each other on the surface of the glass to be tested, and the first illuminated strip and the second illuminated strip satisfy the interference condition. The first illuminated band and the second illuminated band that meet the above conditions on the surface of the glass to be tested can be met in various way...
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Abstract
The invention relates to the field of flat glass, and discloses a method and equipment for measuring the particle size of the flat glass surface. an illuminated strip, the first illuminated strip and the second illuminated strip satisfy the interference condition; a camera configured to capture images of interference fringes formed by the first illuminated strip and the second illuminated strip; and processing and judge whether there are particles on the surface of the glass to be tested according to the image of the interference fringes. The invention detects the particle size on the surface of the flat glass based on the light interference principle, has higher sensitivity and is beneficial to detect finer particles.
Description
technical field [0001] The invention relates to the field of flat glass, in particular to a method and equipment for measuring the particle size of the flat glass surface. Background technique [0002] At present, the detection of particles on the surface of liquid crystal glass substrates usually adopts the light scattering method, and the detection equipment used by the current liquid crystal glass substrate manufacturers all use the light scattering method for measurement. When using the light scattering method to measure, the most sensitive is to detect 1um particles. In practical applications, it is found that 1um particles scatter very little light, and a very high-sensitivity camera is required to meet the requirements. At the same time, although the above method can identify particles of 1um, the detection accuracy of the size is extremely poor. [0003] At the same time, with the advancement of technology, the liquid crystal glass substrate is developing towards a...
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IPC IPC(8): G01N21/88
CPCG01N21/8806
Inventor 周波胡恒广王丽红
Owner DONGXU OPTOELECTRONICS TECH CO LTD