Terahertz wave measuring device, measuring method, and measuring rig

A measurement device and measurement method technology, applied in the field of terahertz wave measurement instruments, can solve problems such as complex calculation or data processing

Active Publication Date: 2016-06-22
ARKRAY INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in this case, due to reflection from the terahertz wave generating element or from the sample (or from the back surface of the sample), the terahertz wave sometimes passes through the interface formed by the respective materials and is subjected to the terahertz wave generated at the interface. The influence of absorption and reflection of terahertz waves in elements, in samples, and in free space, resulting in the need to perform complex calculations or data processing in order to accurately measure the characteristics of the measurement target

Method used

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  • Terahertz wave measuring device, measuring method, and measuring rig
  • Terahertz wave measuring device, measuring method, and measuring rig
  • Terahertz wave measuring device, measuring method, and measuring rig

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Embodiment Construction

[0042] Hereinafter, an exemplary embodiment regarding a terahertz wave measurement device according to the technology disclosed herein will be described in detail with reference to the accompanying drawings.

[0043] first exemplary embodiment

[0044] Such as figure 1 As shown, the terahertz wave measurement device 10 according to the first exemplary embodiment is configured to include an excitation light emitting device 20 for emitting excitation light, a condenser lens 22 for converging the excitation light, and guiding the focused excitation light to a terahertz wave. The mirror 24 of the wave generator 30, the terahertz wave generator 30 that makes the terahertz wave generated by the excitation light incident on the sample, a pair of parabolic mirrors 42A that guide the terahertz wave transmitted through the terahertz wave generator 30, 42B, a detection device 50 for detecting the intensity of the guided terahertz wave, and a processor 52 for processing the detection res...

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Abstract

The invention relates to a terahertz wave measuring device, a measuring method, and a measuring rig. The terahertz wave measuring device includes (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.

Description

technical field [0001] The present disclosure relates to a terahertz wave measuring device, a terahertz wave measuring method, and a terahertz wave measuring instrument (rig). Background technique [0002] Conventionally, in general spectroscopic measurement and imaging using terahertz waves, emitted terahertz waves are guided so as to be incident on a sample in which a light source and the sample are arranged separately from each other. [0003] In addition, measurement methods of terahertz wave characteristics using micro-engineered structures such as microelectromechanical systems (MEMS) and μ-total analysis systems (μ-TAS) have been proposed (see, for example, Japanese Patent Application Laid-Open (JP-A) No. .2012-185151). In such methods, terahertz waves are radiated onto a portion of a liquid solution including at least one type of substance to be measured and having a thickness ranging from 10 μm to 100 μm such that the direction of propagation is the thickness direc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3581
CPCG01N21/3581G01N21/03G01N21/3577G01N2021/058G01J1/08G01J1/42G01J1/0223
Inventor 内田裕久
Owner ARKRAY INC
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