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Improvements related to particle characterization

A characterization and particle technology, applied in individual particle analysis, particle and sedimentation analysis, particle size analysis, etc., to achieve the effect of improving the signal-to-noise ratio

Active Publication Date: 2019-05-14
MALVERN INSTRUMENTS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] This tends to cause further problems in the existing field of particle characterization systems if the dispersant is water

Method used

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  • Improvements related to particle characterization
  • Improvements related to particle characterization
  • Improvements related to particle characterization

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0221] reference figure 1 , A prior art device 10 for particle characterization is shown. The device 10 includes a light source 2 for irradiating a sample chamber 20 with a light beam 8. The device 10 further includes a plurality of detectors (not shown) for detecting light scattered from the sample in the sample chamber 20. The light source 2 is a relatively large HeNe laser. The first mirror 4 and the second mirror 4 are used for bending the optical path of the light beam 8 through two 90 degrees, so that the light source 2 can be accommodated under the optical path of the light beam 8 passing through the sample. This provides a relatively compact device, but, for example, through convective heat transfer, the sample can be indirectly heated by the light source. The triplet lens 6 is arranged between the second mirror 4 and the sample chamber 20 to provide the necessary beam quality through the sample. The light beam 8 converges through the sample.

[0222] figure 2 The sam...

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PUM

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Abstract

A particle characterization apparatus is disclosed comprising: a light source; a sample cell; a collecting lens and a detector. The light source is operable to illuminate a sample comprising dispersed particles within the sample cell with a light beam along a light beam axis. The light beam axis passes through a first wall of the sample cell, through the sample, and through a second wall of the sample cell, so as to produce scattered light by interactions with the sample. The detector is configured to detect light scattered from the sample. The second wall of the sample cell comprises a lens with a convex external surface through which the light beam axis passes. The collecting lens is arranged to collect and focus scattered light leaving the sample cell onto the detector, and comprises an aspheric surface.

Description

Technical field [0001] The present invention relates to a device for characterizing particles, and to a method for characterizing particles. Characterizing the particles can include determining the distribution of particle sizes. Background technique [0002] It is known that the particles in the sample can be characterized by illuminating the sample and measuring the light scattered by the particles. During the measurement process, the particles of the sample are usually dispersed in the sample cell in the dispersant medium. The dispersant medium is usually air or water, and usually flows through the sample chamber during the measurement. [0003] In this type of instrument, the sample chamber usually has a pair of flat, parallel transparent walls, and the sample is illuminated by the first wall. The forward scattered light exits the sample chamber via the opposite second wall, and the backward scattered light exits the sample chamber via the first wall. This arrangement is su...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/02G02B3/00G01N21/49G01N15/14
CPCG01N15/0205G01N15/0211G01N15/1456G01N21/51G01N2021/4707G01N2021/4709G01N2021/4711G02B3/02
Inventor 大卫·斯普里格斯
Owner MALVERN INSTRUMENTS