Improvements related to particle characterization
A characterization and particle technology, applied in individual particle analysis, particle and sedimentation analysis, particle size analysis, etc., to achieve the effect of improving the signal-to-noise ratio
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[0221] reference figure 1 , A prior art device 10 for particle characterization is shown. The device 10 includes a light source 2 for irradiating a sample chamber 20 with a light beam 8. The device 10 further includes a plurality of detectors (not shown) for detecting light scattered from the sample in the sample chamber 20. The light source 2 is a relatively large HeNe laser. The first mirror 4 and the second mirror 4 are used for bending the optical path of the light beam 8 through two 90 degrees, so that the light source 2 can be accommodated under the optical path of the light beam 8 passing through the sample. This provides a relatively compact device, but, for example, through convective heat transfer, the sample can be indirectly heated by the light source. The triplet lens 6 is arranged between the second mirror 4 and the sample chamber 20 to provide the necessary beam quality through the sample. The light beam 8 converges through the sample.
[0222] figure 2 The sam...
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