Device and method for measuring workpiece characteristics
A measurement device and measurement method technology, which is applied in the direction of measurement devices, single semiconductor device testing, electrical measurement, etc., can solve problems such as inability to perform correct measurements, tilting workpiece posture, and increased contact resistance
Active Publication Date: 2016-07-20
TOKYO WELD CO LTD
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Problems solved by technology
Therefore, the contact resistance between the probe and the terminal of the workpiece becomes large, and measurement accuracy cannot be ensured.
In addition, it is difficult not to make the low-hardness part, that is, the light-emitting part, contact any part, but only the high-hardness part, that is, the main body, to contact and fix somewhere around the workpiece storage hole 103, and it is also possible to make it contact. narrow range
Furthermore, if only the high-hardness portion of the workpiece is pressed when fixing it in this way, since the pressing force is applied to a narrow range, abnormalities such as the posture inclination of the workpiece may occur, and accurate measurement may not be possible.
Method used
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[0070] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.
[0071] First, the workpiece W1 measured by the workpiece characteristic measuring apparatus of the present invention will be described. First, the three-dimensional view of the workpiece W1 is shown in figure 2 . The workpiece W1 is a light emitting diode (LED) including a main body W1x, electrodes W1a and W1b formed on the lower surface of the main body W1x, and a light-emitting body W1p. will be from figure 2 In the E1 direction, the F1 direction, the G1 direction, and the H1 direction to observe the workpiece W1, the diagrams are shown in image 3 (a)(b)(c)(d). like image 3 As shown in (a) (b) and (c), the light-emitting body W1p has a shape that covers the upper surface of the main body W1x and protrudes upward from the upper surface.
[0072] Furthermore, the light-emitting body W1p has an edge portion W1e slightly protruding toward the periph...
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The invention provides a device for measuring workpiece characteristics, which can fix a workpiece under the condition of not damaging the low hardness portion of the workpiece to measure workpiece characteristics with high precision, and a method for measuring workpiece characteristics. The device (100) for measuring workpiece characteristics is provided with a workpiece characteristics detection portion (10) arranged on the periphery of a conveying workbench (2) and performing characteristic measurement on a workpiece (W1) contained in a workpiece containing hole. The workpiece characteristics detection portion (10) is provided with a detection part (P1a, P1B) abutting against the workpiece (W1) to perform workpiece characteristics detection; and a fixing unit (15) used for fixing the workpiece (W1) in the workpiece containing hole (3) on the inner wall (3si,5s) sides in the workpiece containing hole (3) opposite to an opening portion. The inner wall (3si,5s) in each workpiece containing hole (3) is provided with a notch portion (3si) which can avoid the low hardness portion of the workpiece (W1) when the workpiece (W1) is abutting against the inner wall.
Description
technical field [0001] The present invention relates to a workpiece in which workpieces such as electronic components are individually accommodated in a plurality of workpiece accommodating holes formed in a conveying table and conveyed, and properties of the workpiece are measured by a workpiece characteristic measuring unit arranged in a rotation path of the conveying table. A characteristic measuring apparatus and a method for measuring characteristics of a workpiece, in particular, when measuring a workpiece having a low-hardness portion that is easily damaged by pressing, and a characteristic measuring apparatus for a workpiece capable of fixing the workpiece without pressing the low-hardness portion, and the characteristics of the workpiece test methods. Background technique [0002] Conventionally, there has been known a workpiece characteristic measuring apparatus that individually accommodates and transports workpieces such as electronic components in a plurality of...
Claims
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Login to View More IPC IPC(8): G01R31/26
CPCG01R31/2601G01R31/2635
Inventor 小岛智幸小平晃久
Owner TOKYO WELD CO LTD