Local ternary pattern texture feature extraction method based on mean sampling

A local ternary pattern and texture feature technology, applied in character and pattern recognition, computer parts, instruments, etc., can solve the problem of not being able to adapt to more than 16 neighborhood sampling points, high dimensionality of feature vectors, rotation invariance and characteristic Insufficient dimensionality and other problems, to achieve the effect of suppressing the influence of noise, controlling the dimension of the mode, and improving the robustness

Inactive Publication Date: 2016-07-20
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF3 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this three-value pattern is not strictly a three-value pattern, and its final encoding is still binary. Similar LTP variants include high-order LTP (high-order LTP) proposed by ZhangY et al. These encoding methods It can only be called "pseudo-ternary mode"
The OLTP proposed by RajaM et al., and the OS-LTP proposed by HuangM et al. all use true three-value mode coding, but they are not enough in terms of rotation invariance and feature dimension, which are exactly what texture features must have. key elements of
[0006] The main disadvantage of the current local ternary pattern texture feature extraction method is that the dimension of the generated feature vector is too high to adapt to more than 16 neighborhood sampling points

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Local ternary pattern texture feature extraction method based on mean sampling
  • Local ternary pattern texture feature extraction method based on mean sampling
  • Local ternary pattern texture feature extraction method based on mean sampling

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0071] In order to better illustrate the technical effects of the present invention, the classic texture database Outex_TC_00010 (abbreviated as OTC10) and the nearest neighbor classifier are used to verify the present invention experimentally.

[0072] The OTC10 database used has a total of 24 types of texture samples, the lumen condition is inca, each type of texture includes 9 different angles, and each angle includes 20 texture images, so the entire database contains 24×9×20=4320 images, images The size of each is 128×128 pixels. Figure 4 It is the OTC10 database texture sample map. In this embodiment, the first 20 samples are selected from each type of texture in OTC10, and a total of 480 texture images are selected as training samples, and the remaining texture images are used to test the accuracy of texture classification.

[0073] In this experimental verification, the number of effective coding pixels is respectively set to P=8, 12, and 16. Therefore, firstly, a mo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a local ternary pattern texture feature extraction method based on mean sampling. First, the dimension of a local ternary coding sequence of all possible values is reduced preliminarily based on rotation invariance and is further reduced according to the dimension reduction conditions, and a pattern mapping table containing the corresponding relationship between original pattern number and final pattern number is built. Neighborhood circular symmetry average sampling is carried out on each non-edge pixel of a texture image of which the features are to be extracted, effective coding points are acquired from sampling points and coded to get a local ternary coding sequence of the non-edge pixels and corresponding original pattern numbers, corresponding final patterns are looked for in the pattern mapping table, the non-edge pixels covered by each final pattern are counted in the texture image, and a feature vector of the texture image is constructed. According to the invention, the noise is controlled and the accuracy of texture features is improved through mean sampling, and the dimension of the feature vector is controlled effectively through a dimension reduction method.

Description

technical field [0001] The invention belongs to the technical field of texture feature extraction, and more specifically relates to a local ternary pattern texture feature extraction method based on mean value sampling. Background technique [0002] The extraction of visual features is an important link in the process of image classification and recognition, and the quality of features directly affects the performance of the entire visual system. In long-term research, scholars have proposed various features to describe specific classification objects, and texture features are one of the important statistical features. It reflects the distribution of the texture pixel structure space in the grayscale image, and is generally the repeated reproduction of a series of texture primitives in the pixel space according to certain arrangement rules. The research on texture feature expression method has great practical significance for content-based image retrieval, remote sensing im...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/46
CPCG06V10/50
Inventor 纪禄平王强卢鑫陈晨尹武松
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products