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Planeness error evaluation method and device

A technology for error evaluation and flatness, which is applied in the field of flatness error evaluation methods and devices, and can solve problems such as complex mathematical models, low calculation efficiency, and limited applications

Inactive Publication Date: 2016-08-10
BEIHANG UNIV
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Problems solved by technology

[0004] Aiming at defects such as low calculation efficiency of existing flatness error evaluation methods, limited application in actual engineering, and complex mathematical models, the present invention proposes a flatness error evaluation method, which includes:

Method used

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  • Planeness error evaluation method and device
  • Planeness error evaluation method and device

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Embodiment approach

[0066] As another preferred embodiment, the method also includes:

[0067] When the minimum area condition is not satisfied, the rotation angle is changed, and steps S2 to S7 are repeated.

[0068] As another preferred embodiment, the initialization of the rotation angle and the current best flatness error in the step S1 includes:

[0069] Measure and obtain the measured point set P of the part plane in the rectangular coordinate system O-XYZ of the measurement space, and express the coordinates of the i-th point in the point set P as P i (x i ,y i ,z i ), and establish a rotation plane S through the z axis, the plane S rotates around the z axis with θ as the rotation angle, and the θ 0 As the iterative initial value of the rotation angle, and let the current best flatness error f best is 0;

[0070] Wherein, the coordinate system O-XYZ includes x-axis, y-axis and z-axis, i=1, 2,...,n, n is the number of measured points, and n is a positive integer greater than or equal ...

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Abstract

The invention relates to a planeness error evaluation method and device. The method includes initiating a rotary angle and a current optimal planeness error; projecting a to-be-tested dot set of a component plane to a projection face under the rotary angle; determining a two-dimensional boss of a projection point in the projection face; determining the minimum dot line distance in the two-dimensional boss; judging whether a minimum area condition is met or not; updating the current optimal planeness error; judging whether a convergence condition is met or not for determining a final planeness error evaluation result. The method provided by the invention is small in calculation amount. The two-dimensional boss of the projection dot set on the projection face is generated by adopting a boss quick generation method and easy implementation is achieved. At the same time, by changing the rotary angle of the projection face, different two-dimensional bosses can be obtained and a solution meeting the minimum area condition can be found. The execution steps are simple and are easy to realize through programming. Therefore, the method and device provided by the invention is easy to apply in practical engineering.

Description

technical field [0001] The invention relates to the field of precision measurement and computer application, in particular to a flatness error evaluation method and device. Background technique [0002] Flatness error is an important index to evaluate whether the design, manufacture and assembly of mechanical parts meet the requirements. The evaluation methods of the flatness error in the national standard GB / T11337-2004 include: the minimum contained area method, the least square method, the diagonal plane method and the three-point plane method. Among them, the evaluation result of the minimum enclosing area method is less than or equal to the other three evaluation methods. At present, the most widely used evaluation methods are the least square method and the minimum contained area method. Although the least square method does not satisfy the minimum area condition in principle, its programming is easy to implement, and its calculation speed is fast, and it can approxi...

Claims

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Application Information

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IPC IPC(8): G01B11/30
CPCG01B11/30
Inventor 陶扬赵军鹏王春洁
Owner BEIHANG UNIV
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