Atomic force microscope-based multifunctional combined probe system

An atomic force microscope and multi-functional combination technology, applied in the field of precision instruments, can solve problems such as hindering the study of friction and wear mechanism, sample surface pollution, damage, etc., to achieve the effect of flexible and convenient probe switching, increase the upper space, and save the working space

Inactive Publication Date: 2016-08-24
SOUTHWEST JIAOTONG UNIV
View PDF10 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when replacing probes with different functions and characterizing chemical components, the original vacuum environment will inevitably be destroyed, and many uncertain factors (such as oxygen and water vapor in the air, etc.) Real and reliable experimental data, and the above-mentioned experimental process is complex and inefficient, which seriously hinders the study of friction and wear mechanism at the micro-nano scale

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Atomic force microscope-based multifunctional combined probe system
  • Atomic force microscope-based multifunctional combined probe system
  • Atomic force microscope-based multifunctional combined probe system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The present invention will be further elaborated below in conjunction with the accompanying drawings and specific embodiments.

[0029] Such as Figure 1-3 As shown in the figure, a multifunctional combination probe can realize different functions such as microscopic friction and wear experiment, surface topography scanning, crystal structure evolution detection and frictional energy dissipation measurement in situ in the same experimental area under various set working environments. needle system. In an embodiment of the present invention, a multifunctional combined probe system based on an atomic force microscope includes a vacuum chamber 1, a chamber top cover 2 installed on the vacuum chamber 1, and a light window top cover installed on the chamber top cover 2 3. The upper cover 2 of the cavity is installed on the vacuum cavity 1 through screw connection, and the vacuum cavity 1 and the upper cover 2 of the cavity are both provided with grooves for sealing rubber s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention discloses an atomic force microscope-based multifunctional combined probe system. The system can switch the probes having different functions in various set working environments by the program control and in an in situ switching manner, thereby in situ realizing the functions, such as the microscopic friction and wear experiments, the surface topography scanning, the crystal structure evolution and detection, the friction energy dissipation measurement, etc., in a same experiment area. When the system switches the probes in the in situ switching manner, the working environment does not need to be destroyed, thereby avoiding the pollution of the external environment to the sample surfaces effectively.

Description

technical field [0001] The invention belongs to the field of precision instruments, and in particular relates to a multifunctional combined probe system based on an atomic force microscope, which can realize microscopic friction and wear experiments and surface topography scanning in situ on the same experimental area in various set working environments , detection of crystal structure evolution and measurement of frictional energy dissipation. Background technique [0002] The atomic force microscope is a precision instrument for studying the surface structure of solid materials including insulators by detecting the weak interaction between the measured sample and the probe. The atomic force microscope has played an important role in the fields of material science and life science, and promoted the development of nanotechnology. It is an important instrument for research at the micro-nano scale. Typically, an atomic force microscope can only be fitted with a probe with a s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/38
CPCG01Q60/38
Inventor 钱林茂张超杰江亮余丙军邹乙稼
Owner SOUTHWEST JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap