Apparatus and method for detecting defect of optical film

Abstract

The invention provides an apparatus and a method for detecting the defect of an optical film. The apparatus for detecting the defect of the optical film comprises a receiving part used for receiving the detect information of an optical film roll from at least one detection apparatus; a defect part decision part used for deciding the defect part of the optical film roll in the corresponding two-dimensional plane based on the defect information; a searching part used for searching a region of the plane based on the defect part, wherein a preset number of defects exist in the above region; and a defect detecting part used for detecting periodic defects based on the number of defects in the searched region and the interval between the defects.

Description

technical field [0001] The present invention relates to a technique for detecting defects generated during the process of an optical film. Background technique [0002] Usually, when defects with the same interval continuously occur at a certain value or more during the process of an optical film roll, the area is designated as a special control area and further inspected by a product inspector. [0003] At this time, the product inspector observes the defect detection map (two-dimensional coordinate map) to judge whether it is a periodic defect. However, due to the difference in proficiency among product inspectors, and it is difficult to perceive the difference in the interval standard between defects caused by the change of the scale of the X / Y axis of the defect detection chart, it is difficult to accurately and accurately identify a large number of rolls. It is difficult to identify and manage consistent periodic defects. Furthermore, when inspection is performed by a...

AI Technical Summary

Problems solved by technology

However, due to the difference in proficiency among product inspectors, and it is difficult to perceive the difference in the interval standard between defects caused by the change of the scale of the X / Y axis of the defect detection chart, it is difficult to accurately and accurately identify a large number of rolls. Difficulty in identifying and managing consistent periodic defects

In addition, in the case of inspection by a product inspector, there is a problem that a large amount of cost and time are required for the inspection work.

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